Spatio-Temporal Deep Learning-Based Methods for Defect Detection: An Industrial Application Study Case
Data-driven methods—particularly machine learning techniques—are expected to play a key role in the headway of Industry 4.0. One increasingly popular application in this context is when anomaly detection is employed to test manufactured goods in assembly lines. In this work, we compare supervised, s...
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| Autores principales: | , , , , , , , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
MDPI AG
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/767bfa1dee5a46788481ad3eea69f2e1 |
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