Electron ptychographic microscopy for three-dimensional imaging

Three-dimensional ptychographic imaging with electrons has remained a challenge because, unlike X-rays, electrons are easily scattered by atoms. Here, Gao et al. extend multi-slice methods to electrons in the multiple scattering regime, paving the way to nanometer-scale 3D structure determination wi...

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Autores principales:	Si Gao, Peng Wang, Fucai Zhang, Gerardo T. Martinez, Peter D. Nellist, Xiaoqing Pan, Angus I. Kirkland
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/781ca002c7e44d20b92f6d9431ca3c11
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id	oai:doaj.org-article:781ca002c7e44d20b92f6d9431ca3c11
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spelling	oai:doaj.org-article:781ca002c7e44d20b92f6d9431ca3c112021-12-02T10:48:28ZElectron ptychographic microscopy for three-dimensional imaging10.1038/s41467-017-00150-12041-1723https://doaj.org/article/781ca002c7e44d20b92f6d9431ca3c112017-07-01T00:00:00Zhttps://doi.org/10.1038/s41467-017-00150-1https://doaj.org/toc/2041-1723Three-dimensional ptychographic imaging with electrons has remained a challenge because, unlike X-rays, electrons are easily scattered by atoms. Here, Gao et al. extend multi-slice methods to electrons in the multiple scattering regime, paving the way to nanometer-scale 3D structure determination with electrons.Si GaoPeng WangFucai ZhangGerardo T. MartinezPeter D. NellistXiaoqing PanAngus I. KirklandNature PortfolioarticleScienceQENNature Communications, Vol 8, Iss 1, Pp 1-8 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Si Gao Peng Wang Fucai Zhang Gerardo T. Martinez Peter D. Nellist Xiaoqing Pan Angus I. Kirkland Electron ptychographic microscopy for three-dimensional imaging
description	Three-dimensional ptychographic imaging with electrons has remained a challenge because, unlike X-rays, electrons are easily scattered by atoms. Here, Gao et al. extend multi-slice methods to electrons in the multiple scattering regime, paving the way to nanometer-scale 3D structure determination with electrons.
format	article
author	Si Gao Peng Wang Fucai Zhang Gerardo T. Martinez Peter D. Nellist Xiaoqing Pan Angus I. Kirkland
author_facet	Si Gao Peng Wang Fucai Zhang Gerardo T. Martinez Peter D. Nellist Xiaoqing Pan Angus I. Kirkland
author_sort	Si Gao
title	Electron ptychographic microscopy for three-dimensional imaging
title_short	Electron ptychographic microscopy for three-dimensional imaging
title_full	Electron ptychographic microscopy for three-dimensional imaging
title_fullStr	Electron ptychographic microscopy for three-dimensional imaging
title_full_unstemmed	Electron ptychographic microscopy for three-dimensional imaging
title_sort	electron ptychographic microscopy for three-dimensional imaging
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/781ca002c7e44d20b92f6d9431ca3c11
work_keys_str_mv	AT sigao electronptychographicmicroscopyforthreedimensionalimaging AT pengwang electronptychographicmicroscopyforthreedimensionalimaging AT fucaizhang electronptychographicmicroscopyforthreedimensionalimaging AT gerardotmartinez electronptychographicmicroscopyforthreedimensionalimaging AT peterdnellist electronptychographicmicroscopyforthreedimensionalimaging AT xiaoqingpan electronptychographicmicroscopyforthreedimensionalimaging AT angusikirkland electronptychographicmicroscopyforthreedimensionalimaging
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Electron ptychographic microscopy for three-dimensional imaging

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