$Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction$
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Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction

Abstract Advanced structural characterisation techniques which are rapid to use, non-destructive and structurally definitive on the nanoscale are in demand, especially for a detailed understanding of extended-defects and their influence on the properties of materials. We have applied the electron ba...

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Autores principales:	G. Naresh-Kumar, A. Vilalta-Clemente, H. Jussila, A. Winkelmann, G. Nolze, S. Vespucci, S. Nagarajan, A. J. Wilkinson, C. Trager-Cowan
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/7a701a8afcb4427cb34c15378c2ede56
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spelling	oai:doaj.org-article:7a701a8afcb4427cb34c15378c2ede562021-12-02T15:05:27ZQuantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction10.1038/s41598-017-11187-z2045-2322https://doaj.org/article/7a701a8afcb4427cb34c15378c2ede562017-09-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-11187-zhttps://doaj.org/toc/2045-2322Abstract Advanced structural characterisation techniques which are rapid to use, non-destructive and structurally definitive on the nanoscale are in demand, especially for a detailed understanding of extended-defects and their influence on the properties of materials. We have applied the electron backscatter diffraction (EBSD) technique in a scanning electron microscope to non-destructively characterise and quantify antiphase domains (APDs) in GaP thin films grown on different (001) Si substrates with different offcuts. We were able to image and quantify APDs by relating the asymmetrical intensity distributions observed in the EBSD patterns acquired experimentally and comparing the same with the dynamical electron diffraction simulations. Additionally mean angular error maps were also plotted using automated cross-correlation based approaches to image APDs. Samples grown on substrates with a 4° offcut from the [110] do not show any APDs, whereas samples grown on the exactly oriented substrates contain APDs. The procedures described in our work can be adopted for characterising a wide range of other material systems possessing non-centrosymmetric point groups.G. Naresh-KumarA. Vilalta-ClementeH. JussilaA. WinkelmannG. NolzeS. VespucciS. NagarajanA. J. WilkinsonC. Trager-CowanNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-10 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q G. Naresh-Kumar A. Vilalta-Clemente H. Jussila A. Winkelmann G. Nolze S. Vespucci S. Nagarajan A. J. Wilkinson C. Trager-Cowan Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
description	Abstract Advanced structural characterisation techniques which are rapid to use, non-destructive and structurally definitive on the nanoscale are in demand, especially for a detailed understanding of extended-defects and their influence on the properties of materials. We have applied the electron backscatter diffraction (EBSD) technique in a scanning electron microscope to non-destructively characterise and quantify antiphase domains (APDs) in GaP thin films grown on different (001) Si substrates with different offcuts. We were able to image and quantify APDs by relating the asymmetrical intensity distributions observed in the EBSD patterns acquired experimentally and comparing the same with the dynamical electron diffraction simulations. Additionally mean angular error maps were also plotted using automated cross-correlation based approaches to image APDs. Samples grown on substrates with a 4° offcut from the [110] do not show any APDs, whereas samples grown on the exactly oriented substrates contain APDs. The procedures described in our work can be adopted for characterising a wide range of other material systems possessing non-centrosymmetric point groups.
format	article
author	G. Naresh-Kumar A. Vilalta-Clemente H. Jussila A. Winkelmann G. Nolze S. Vespucci S. Nagarajan A. J. Wilkinson C. Trager-Cowan
author_facet	G. Naresh-Kumar A. Vilalta-Clemente H. Jussila A. Winkelmann G. Nolze S. Vespucci S. Nagarajan A. J. Wilkinson C. Trager-Cowan
author_sort	G. Naresh-Kumar
title	Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
title_short	Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
title_full	Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
title_fullStr	Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
title_full_unstemmed	Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
title_sort	quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/7a701a8afcb4427cb34c15378c2ede56
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Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction

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