Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)

Abstract The following invention - Graphene Enhanced Secondary Ion Mass Spectrometry - (pending European patent application no. EP 16461554.4) is related to a method of analysing a solid substrate by means of Secondary Ion Mass Spectrometry (SIMS). It comprises the steps of providing a graphene laye...

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Autores principales:	Paweł Piotr Michałowski, Wawrzyniec Kaszub, Iwona Pasternak, Włodek Strupiński
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/7c2bf08d3b674ec3acf20de4206fbf05
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spelling	oai:doaj.org-article:7c2bf08d3b674ec3acf20de4206fbf052021-12-02T11:53:13ZGraphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)10.1038/s41598-017-07984-12045-2322https://doaj.org/article/7c2bf08d3b674ec3acf20de4206fbf052017-08-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-07984-1https://doaj.org/toc/2045-2322Abstract The following invention - Graphene Enhanced Secondary Ion Mass Spectrometry - (pending European patent application no. EP 16461554.4) is related to a method of analysing a solid substrate by means of Secondary Ion Mass Spectrometry (SIMS). It comprises the steps of providing a graphene layer over the substrate surface and analysing ejected secondary anions through mass spectrometry analysis. The graphene layer acts as a kind of filament that emits a lot of secondary electrons during the experiment which significantly increases the negative ionization probability and thus the intensity of the SIMS signal can be more than two orders of magnitude higher than that of a similar sample without graphene. The method is particularly useful for the analysis of surfaces, 2D materials and ultra-thin films. The intensity of dopants and contamination signals can be enhanced up to 35 times, which approaches the detection limit of ~1015 atoms/cm 3, otherwise unreachable in a standard static SIMS analysis.Paweł Piotr MichałowskiWawrzyniec KaszubIwona PasternakWłodek StrupińskiNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-8 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Paweł Piotr Michałowski Wawrzyniec Kaszub Iwona Pasternak Włodek Strupiński Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)
description	Abstract The following invention - Graphene Enhanced Secondary Ion Mass Spectrometry - (pending European patent application no. EP 16461554.4) is related to a method of analysing a solid substrate by means of Secondary Ion Mass Spectrometry (SIMS). It comprises the steps of providing a graphene layer over the substrate surface and analysing ejected secondary anions through mass spectrometry analysis. The graphene layer acts as a kind of filament that emits a lot of secondary electrons during the experiment which significantly increases the negative ionization probability and thus the intensity of the SIMS signal can be more than two orders of magnitude higher than that of a similar sample without graphene. The method is particularly useful for the analysis of surfaces, 2D materials and ultra-thin films. The intensity of dopants and contamination signals can be enhanced up to 35 times, which approaches the detection limit of ~1015 atoms/cm 3, otherwise unreachable in a standard static SIMS analysis.
format	article
author	Paweł Piotr Michałowski Wawrzyniec Kaszub Iwona Pasternak Włodek Strupiński
author_facet	Paweł Piotr Michałowski Wawrzyniec Kaszub Iwona Pasternak Włodek Strupiński
author_sort	Paweł Piotr Michałowski
title	Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)
title_short	Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)
title_full	Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)
title_fullStr	Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)
title_full_unstemmed	Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)
title_sort	graphene enhanced secondary ion mass spectrometry (gesims)
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/7c2bf08d3b674ec3acf20de4206fbf05
work_keys_str_mv	AT pawełpiotrmichałowski grapheneenhancedsecondaryionmassspectrometrygesims AT wawrzynieckaszub grapheneenhancedsecondaryionmassspectrometrygesims AT iwonapasternak grapheneenhancedsecondaryionmassspectrometrygesims AT włodekstrupinski grapheneenhancedsecondaryionmassspectrometrygesims
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Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)

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