Correlating Time Series Signals and Event Logs in Embedded Systems

In many embedded systems, we face the problem of correlating signals characterising device operation (e.g., performance parameters, anomalies) with events describing internal device activities. This leads to the investigation of two types of data: time series, representing signal periodic samples in...

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Autores principales: Kazimierz Krosman, Janusz Sosnowski
Formato: article
Lenguaje:EN
Publicado: MDPI AG 2021
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Acceso en línea:https://doaj.org/article/7f3016852ffb45d2a1a87499a238802e
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