Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization

Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials; however, data are often complicated by the measurement apparatus, sample preparation conditions and low signal-to-noise ratio. Here, the auth...

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Autores principales:	Seth Kenkel, Shachi Mittal, Rohit Bhargava
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2020
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/7f60d745978c43e895338ddbcc95cafe
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spelling	oai:doaj.org-article:7f60d745978c43e895338ddbcc95cafe2021-12-02T17:45:15ZClosed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization10.1038/s41467-020-17043-52041-1723https://doaj.org/article/7f60d745978c43e895338ddbcc95cafe2020-06-01T00:00:00Zhttps://doi.org/10.1038/s41467-020-17043-5https://doaj.org/toc/2041-1723Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials; however, data are often complicated by the measurement apparatus, sample preparation conditions and low signal-to-noise ratio. Here, the authors demonstrate a closed-loop controlled AFM-IR instrument design to address measurement artifacts and reduce noise up to 5x compared to previous methods.Seth KenkelShachi MittalRohit BhargavaNature PortfolioarticleScienceQENNature Communications, Vol 11, Iss 1, Pp 1-10 (2020)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Seth Kenkel Shachi Mittal Rohit Bhargava Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
description	Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials; however, data are often complicated by the measurement apparatus, sample preparation conditions and low signal-to-noise ratio. Here, the authors demonstrate a closed-loop controlled AFM-IR instrument design to address measurement artifacts and reduce noise up to 5x compared to previous methods.
format	article
author	Seth Kenkel Shachi Mittal Rohit Bhargava
author_facet	Seth Kenkel Shachi Mittal Rohit Bhargava
author_sort	Seth Kenkel
title	Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
title_short	Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
title_full	Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
title_fullStr	Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
title_full_unstemmed	Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
title_sort	closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
publisher	Nature Portfolio
publishDate	2020
url	https://doaj.org/article/7f60d745978c43e895338ddbcc95cafe
work_keys_str_mv	AT sethkenkel closedloopatomicforcemicroscopyinfraredspectroscopicimagingfornanoscalemolecularcharacterization AT shachimittal closedloopatomicforcemicroscopyinfraredspectroscopicimagingfornanoscalemolecularcharacterization AT rohitbhargava closedloopatomicforcemicroscopyinfraredspectroscopicimagingfornanoscalemolecularcharacterization
_version_	1718379596611584000

Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization

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