Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface

Whether and under what circumstances chemical bonds could be imaged via force microscopy is a controversial topic. Here authors develop a particular combination of model surface, imaging procedures and simulation approach and discuss possible indications of chemical contrast in imaging data they obt...

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Autores principales: Hatem Labidi, Mohammad Koleini, Taleana Huff, Mark Salomons, Martin Cloutier, Jason Pitters, Robert A. Wolkow
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
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Acceso en línea:https://doaj.org/article/7f62c2da679d44159037908d05c0fd1e
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spelling oai:doaj.org-article:7f62c2da679d44159037908d05c0fd1e2021-12-02T14:42:39ZIndications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface10.1038/ncomms142222041-1723https://doaj.org/article/7f62c2da679d44159037908d05c0fd1e2017-02-01T00:00:00Zhttps://doi.org/10.1038/ncomms14222https://doaj.org/toc/2041-1723Whether and under what circumstances chemical bonds could be imaged via force microscopy is a controversial topic. Here authors develop a particular combination of model surface, imaging procedures and simulation approach and discuss possible indications of chemical contrast in imaging data they obtain.Hatem LabidiMohammad KoleiniTaleana HuffMark SalomonsMartin CloutierJason PittersRobert A. WolkowNature PortfolioarticleScienceQENNature Communications, Vol 8, Iss 1, Pp 1-7 (2017)
institution DOAJ
collection DOAJ
language EN
topic Science
Q
spellingShingle Science
Q
Hatem Labidi
Mohammad Koleini
Taleana Huff
Mark Salomons
Martin Cloutier
Jason Pitters
Robert A. Wolkow
Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface
description Whether and under what circumstances chemical bonds could be imaged via force microscopy is a controversial topic. Here authors develop a particular combination of model surface, imaging procedures and simulation approach and discuss possible indications of chemical contrast in imaging data they obtain.
format article
author Hatem Labidi
Mohammad Koleini
Taleana Huff
Mark Salomons
Martin Cloutier
Jason Pitters
Robert A. Wolkow
author_facet Hatem Labidi
Mohammad Koleini
Taleana Huff
Mark Salomons
Martin Cloutier
Jason Pitters
Robert A. Wolkow
author_sort Hatem Labidi
title Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface
title_short Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface
title_full Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface
title_fullStr Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface
title_full_unstemmed Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface
title_sort indications of chemical bond contrast in afm images of a hydrogen-terminated silicon surface
publisher Nature Portfolio
publishDate 2017
url https://doaj.org/article/7f62c2da679d44159037908d05c0fd1e
work_keys_str_mv AT hatemlabidi indicationsofchemicalbondcontrastinafmimagesofahydrogenterminatedsiliconsurface
AT mohammadkoleini indicationsofchemicalbondcontrastinafmimagesofahydrogenterminatedsiliconsurface
AT taleanahuff indicationsofchemicalbondcontrastinafmimagesofahydrogenterminatedsiliconsurface
AT marksalomons indicationsofchemicalbondcontrastinafmimagesofahydrogenterminatedsiliconsurface
AT martincloutier indicationsofchemicalbondcontrastinafmimagesofahydrogenterminatedsiliconsurface
AT jasonpitters indicationsofchemicalbondcontrastinafmimagesofahydrogenterminatedsiliconsurface
AT robertawolkow indicationsofchemicalbondcontrastinafmimagesofahydrogenterminatedsiliconsurface
_version_ 1718389638930890752