Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface
Whether and under what circumstances chemical bonds could be imaged via force microscopy is a controversial topic. Here authors develop a particular combination of model surface, imaging procedures and simulation approach and discuss possible indications of chemical contrast in imaging data they obt...
Guardado en:
Autores principales: | Hatem Labidi, Mohammad Koleini, Taleana Huff, Mark Salomons, Martin Cloutier, Jason Pitters, Robert A. Wolkow |
---|---|
Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2017
|
Materias: | |
Acceso en línea: | https://doaj.org/article/7f62c2da679d44159037908d05c0fd1e |
Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
Ejemplares similares
-
Lithography for robust and editable atomic-scale silicon devices and memories
por: Roshan Achal, et al.
Publicado: (2018) -
Time-resolved single dopant charge dynamics in silicon
por: Mohammad Rashidi, et al.
Publicado: (2016) -
Silicon–silicon π single bond
por: Soichiro Kyushin, et al.
Publicado: (2020) -
Systematic analysis and nanoscale chemical imaging of polymers using photothermal-induced resonance (AFM-IR) infrared spectroscopy
por: A. Catarina V.D. dos Santos, et al.
Publicado: (2022) -
Investigation of Bonded Connections with Silicone under Shear Loading
por: Y. Staudt, et al.
Publicado: (2016)