Ultralow-power switching via defect engineering in germanium telluride phase-change memory devices

Phase change memories involve crystalline-to-amorphous transformations which require high current densities. Here, the authors introduce extended defects in GeTe crystals, reduce the current densities necessary for amorphization and obtain low-power, scalable memories with multiple resistance states...

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Auteurs principaux: Pavan Nukala, Chia-Chun Lin, Russell Composto, Ritesh Agarwal
Format: article
Langue:EN
Publié: Nature Portfolio 2016
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Accès en ligne:https://doaj.org/article/7f9c771311d547fda7ea11260646e288
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