Metallic conduction through van der Waals interfaces in ultrathin $$\hbox{Bi}_2\hbox{Te}_3$$ Bi 2 Te 3 films
Abstract While the van der Waals (vdW) interface in layered materials hinders the transport of charge carriers in the vertical direction, it serves a good horizontal conduction path. We have investigated electrical conduction of few quintuple-layer (QL) $$\hbox {Bi}_2\hbox {Te}_3$$ Bi 2 Te 3 films b...
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Nature Portfolio
2021
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oai:doaj.org-article:8227bbf7549c4d1d8066a8e3a879eaf62021-12-02T13:34:57ZMetallic conduction through van der Waals interfaces in ultrathin $$\hbox{Bi}_2\hbox{Te}_3$$ Bi 2 Te 3 films10.1038/s41598-021-85078-92045-2322https://doaj.org/article/8227bbf7549c4d1d8066a8e3a879eaf62021-03-01T00:00:00Zhttps://doi.org/10.1038/s41598-021-85078-9https://doaj.org/toc/2045-2322Abstract While the van der Waals (vdW) interface in layered materials hinders the transport of charge carriers in the vertical direction, it serves a good horizontal conduction path. We have investigated electrical conduction of few quintuple-layer (QL) $$\hbox {Bi}_2\hbox {Te}_3$$ Bi 2 Te 3 films by in situ four-point probe conductivity measurement. The impact of the vdW (Te–Te) interface appeared as a large conductivity increase with increasing thickness from 1 to 2 QL. Angle-resolved photoelectron spectroscopy and first-principles calculations reveal the confinement of bulk-like conduction band (CB) state into the vdW interface. Our analysis based on the Boltzmann equation showed that the conduction of the CB has a long mean free path compared to the surface-state conduction. This is mainly attributed to the spatial separation of the CB electrons and the donor defects located at the Bi sites.Shinichiro HattaKo ObayashiHiroshi OkuyamaTetsuya ArugaNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 11, Iss 1, Pp 1-8 (2021) |
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Medicine R Science Q Shinichiro Hatta Ko Obayashi Hiroshi Okuyama Tetsuya Aruga Metallic conduction through van der Waals interfaces in ultrathin $$\hbox{Bi}_2\hbox{Te}_3$$ Bi 2 Te 3 films |
description |
Abstract While the van der Waals (vdW) interface in layered materials hinders the transport of charge carriers in the vertical direction, it serves a good horizontal conduction path. We have investigated electrical conduction of few quintuple-layer (QL) $$\hbox {Bi}_2\hbox {Te}_3$$ Bi 2 Te 3 films by in situ four-point probe conductivity measurement. The impact of the vdW (Te–Te) interface appeared as a large conductivity increase with increasing thickness from 1 to 2 QL. Angle-resolved photoelectron spectroscopy and first-principles calculations reveal the confinement of bulk-like conduction band (CB) state into the vdW interface. Our analysis based on the Boltzmann equation showed that the conduction of the CB has a long mean free path compared to the surface-state conduction. This is mainly attributed to the spatial separation of the CB electrons and the donor defects located at the Bi sites. |
format |
article |
author |
Shinichiro Hatta Ko Obayashi Hiroshi Okuyama Tetsuya Aruga |
author_facet |
Shinichiro Hatta Ko Obayashi Hiroshi Okuyama Tetsuya Aruga |
author_sort |
Shinichiro Hatta |
title |
Metallic conduction through van der Waals interfaces in ultrathin $$\hbox{Bi}_2\hbox{Te}_3$$ Bi 2 Te 3 films |
title_short |
Metallic conduction through van der Waals interfaces in ultrathin $$\hbox{Bi}_2\hbox{Te}_3$$ Bi 2 Te 3 films |
title_full |
Metallic conduction through van der Waals interfaces in ultrathin $$\hbox{Bi}_2\hbox{Te}_3$$ Bi 2 Te 3 films |
title_fullStr |
Metallic conduction through van der Waals interfaces in ultrathin $$\hbox{Bi}_2\hbox{Te}_3$$ Bi 2 Te 3 films |
title_full_unstemmed |
Metallic conduction through van der Waals interfaces in ultrathin $$\hbox{Bi}_2\hbox{Te}_3$$ Bi 2 Te 3 films |
title_sort |
metallic conduction through van der waals interfaces in ultrathin $$\hbox{bi}_2\hbox{te}_3$$ bi 2 te 3 films |
publisher |
Nature Portfolio |
publishDate |
2021 |
url |
https://doaj.org/article/8227bbf7549c4d1d8066a8e3a879eaf6 |
work_keys_str_mv |
AT shinichirohatta metallicconductionthroughvanderwaalsinterfacesinultrathinhboxbi2hboxte3bi2te3films AT koobayashi metallicconductionthroughvanderwaalsinterfacesinultrathinhboxbi2hboxte3bi2te3films AT hiroshiokuyama metallicconductionthroughvanderwaalsinterfacesinultrathinhboxbi2hboxte3bi2te3films AT tetsuyaaruga metallicconductionthroughvanderwaalsinterfacesinultrathinhboxbi2hboxte3bi2te3films |
_version_ |
1718392747168104448 |