Quantitative probe for in-plane piezoelectric coupling in 2D materials

Abstract Piezoelectric response in two-dimensional (2D) materials has evoked immense interest in using them for various applications involving electromechanical coupling. In most of the 2D materials, piezoelectricity is coupled along the in-plane direction. Here, we propose a technique to probe the...

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Autores principales:	Sai Saraswathi Yarajena, Rabindra Biswas, Varun Raghunathan, Akshay K. Naik
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2021
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/8304f865d8634d97943ecd308181dc64
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spelling	oai:doaj.org-article:8304f865d8634d97943ecd308181dc642021-12-02T18:18:06ZQuantitative probe for in-plane piezoelectric coupling in 2D materials10.1038/s41598-021-86252-92045-2322https://doaj.org/article/8304f865d8634d97943ecd308181dc642021-03-01T00:00:00Zhttps://doi.org/10.1038/s41598-021-86252-9https://doaj.org/toc/2045-2322Abstract Piezoelectric response in two-dimensional (2D) materials has evoked immense interest in using them for various applications involving electromechanical coupling. In most of the 2D materials, piezoelectricity is coupled along the in-plane direction. Here, we propose a technique to probe the in-plane piezoelectric coupling strength in layered nanomaterials quantitively. The method involves a novel approach for in-plane field excitation in lateral Piezoresponse force microscopy (PFM) for 2D materials. Operating near contact resonance has enabled the measurement of the piezoelectric coupling coefficients in the sub pm/V range. Detailed methodology for the signal calibration and the background subtraction when PFM is operated near the contact resonance of the cantilever is also provided. The technique is verified by estimating the in-plane piezoelectric coupling coefficients (d 11) for freely suspended MoS2 of one to five atomic layers. For 2D-MoS2 with the odd number of atomic layers, which are non-centrosymmetric, finite d 11 is measured. The measurements also indicate that the coupling strength decreases with an increase in the number of layers. The techniques presented would be an effective tool to study the in-plane piezoelectricity quantitatively in various materials along with emerging 2D-materials.Sai Saraswathi YarajenaRabindra BiswasVarun RaghunathanAkshay K. NaikNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 11, Iss 1, Pp 1-9 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Sai Saraswathi Yarajena Rabindra Biswas Varun Raghunathan Akshay K. Naik Quantitative probe for in-plane piezoelectric coupling in 2D materials
description	Abstract Piezoelectric response in two-dimensional (2D) materials has evoked immense interest in using them for various applications involving electromechanical coupling. In most of the 2D materials, piezoelectricity is coupled along the in-plane direction. Here, we propose a technique to probe the in-plane piezoelectric coupling strength in layered nanomaterials quantitively. The method involves a novel approach for in-plane field excitation in lateral Piezoresponse force microscopy (PFM) for 2D materials. Operating near contact resonance has enabled the measurement of the piezoelectric coupling coefficients in the sub pm/V range. Detailed methodology for the signal calibration and the background subtraction when PFM is operated near the contact resonance of the cantilever is also provided. The technique is verified by estimating the in-plane piezoelectric coupling coefficients (d 11) for freely suspended MoS2 of one to five atomic layers. For 2D-MoS2 with the odd number of atomic layers, which are non-centrosymmetric, finite d 11 is measured. The measurements also indicate that the coupling strength decreases with an increase in the number of layers. The techniques presented would be an effective tool to study the in-plane piezoelectricity quantitatively in various materials along with emerging 2D-materials.
format	article
author	Sai Saraswathi Yarajena Rabindra Biswas Varun Raghunathan Akshay K. Naik
author_facet	Sai Saraswathi Yarajena Rabindra Biswas Varun Raghunathan Akshay K. Naik
author_sort	Sai Saraswathi Yarajena
title	Quantitative probe for in-plane piezoelectric coupling in 2D materials
title_short	Quantitative probe for in-plane piezoelectric coupling in 2D materials
title_full	Quantitative probe for in-plane piezoelectric coupling in 2D materials
title_fullStr	Quantitative probe for in-plane piezoelectric coupling in 2D materials
title_full_unstemmed	Quantitative probe for in-plane piezoelectric coupling in 2D materials
title_sort	quantitative probe for in-plane piezoelectric coupling in 2d materials
publisher	Nature Portfolio
publishDate	2021
url	https://doaj.org/article/8304f865d8634d97943ecd308181dc64
work_keys_str_mv	AT saisaraswathiyarajena quantitativeprobeforinplanepiezoelectriccouplingin2dmaterials AT rabindrabiswas quantitativeprobeforinplanepiezoelectriccouplingin2dmaterials AT varunraghunathan quantitativeprobeforinplanepiezoelectriccouplingin2dmaterials AT akshayknaik quantitativeprobeforinplanepiezoelectriccouplingin2dmaterials
_version_	1718378284915359744

Quantitative probe for in-plane piezoelectric coupling in 2D materials

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