Electronic Band Alignment at Complex Oxide Interfaces Measured by Scanning Photocurrent Microscopy

Electronic Band Alignment at Complex Oxide Interfaces Measured by Scanning Photocurrent Microscopy

Abstract The band alignment at an Al2O3/SrTiO3 heterointerface forming a two-dimensional electron gas (2DEG) was investigated using scanning photocurrent microscopy (SPCM) in an electrolyte-gated environment. We used a focused UV laser source for above-the-bandgap illumination on the SrTiO3 layer, c...

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Autores principales: J. H. Yoon, H. J. Jung, J. T. Hong, Ji-Yong Park, Soonil Lee, S. W. Lee, Y. H. Ahn
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
Materias:
Medicine
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Science
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Acceso en línea:https://doaj.org/article/8418fa99bda8476cb1f9c4795cab38e9
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