Reliability of vertical-cavity surface-emitting laser arrays with redundancy
This paper describes theoretical reliability analysis of a system containing n optical ports in which each optical port contains m redundant vertical-cavity surface-emitting lasers. We study the wearout failure statistics, modelled with lognormal distribution, for three different chip-level integrat...
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Taylor & Francis Group
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/848f614c5f974268a7285c9cdb686365 |
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| Sumario: | This paper describes theoretical reliability analysis of a system containing n optical ports in which each optical port contains m redundant vertical-cavity surface-emitting lasers. We study the wearout failure statistics, modelled with lognormal distribution, for three different chip-level integration approaches: (A) each laser on its own chip, resulting in m·n chips, (B) m redundant lasers associated with one channel are on a single chip, resulting in n chips, and (C) all m·n lasers integrated on a single chip. We present a model that includes the run-to-run reliability parameter fluctuation and find that the three integration schemes consistently exhibit MTTF(C) ≥ MTTF(A) ≥ MTTF(B) for lognormal distribution shape parameters observed in commercial vertical-cavity surface-emitting lasers. We also provide analytic approximations for the failure statistics for all three integration approaches enabling straightforward calculation of the failure statistics for any redundancy and channel number. |
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