Reliability of vertical-cavity surface-emitting laser arrays with redundancy

This paper describes theoretical reliability analysis of a system containing n optical ports in which each optical port contains m redundant vertical-cavity surface-emitting lasers. We study the wearout failure statistics, modelled with lognormal distribution, for three different chip-level integrat...

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Autor principal:	Dubravko Babić
Formato:	article
Lenguaje:	EN
Publicado:	Taylor & Francis Group 2021
Materias:	vertical-cavity surface-emitting laser arrays integration reliability redundancy failure statistics Control engineering systems. Automatic machinery (General) TJ212-225 Automation T59.5
Acceso en línea:	https://doaj.org/article/848f614c5f974268a7285c9cdb686365
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spelling	oai:doaj.org-article:848f614c5f974268a7285c9cdb6863652021-11-04T15:00:41ZReliability of vertical-cavity surface-emitting laser arrays with redundancy0005-11441848-338010.1080/00051144.2021.1969148https://doaj.org/article/848f614c5f974268a7285c9cdb6863652021-10-01T00:00:00Zhttp://dx.doi.org/10.1080/00051144.2021.1969148https://doaj.org/toc/0005-1144https://doaj.org/toc/1848-3380This paper describes theoretical reliability analysis of a system containing n optical ports in which each optical port contains m redundant vertical-cavity surface-emitting lasers. We study the wearout failure statistics, modelled with lognormal distribution, for three different chip-level integration approaches: (A) each laser on its own chip, resulting in m·n chips, (B) m redundant lasers associated with one channel are on a single chip, resulting in n chips, and (C) all m·n lasers integrated on a single chip. We present a model that includes the run-to-run reliability parameter fluctuation and find that the three integration schemes consistently exhibit MTTF(C) ≥ MTTF(A) ≥ MTTF(B) for lognormal distribution shape parameters observed in commercial vertical-cavity surface-emitting lasers. We also provide analytic approximations for the failure statistics for all three integration approaches enabling straightforward calculation of the failure statistics for any redundancy and channel number.Dubravko BabićTaylor & Francis Grouparticlevertical-cavity surface-emitting laser arraysintegrationreliabilityredundancyfailure statisticsControl engineering systems. Automatic machinery (General)TJ212-225AutomationT59.5ENAutomatika, Vol 62, Iss 3-4, Pp 365-374 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	vertical-cavity surface-emitting laser arrays integration reliability redundancy failure statistics Control engineering systems. Automatic machinery (General) TJ212-225 Automation T59.5
spellingShingle	vertical-cavity surface-emitting laser arrays integration reliability redundancy failure statistics Control engineering systems. Automatic machinery (General) TJ212-225 Automation T59.5 Dubravko Babić Reliability of vertical-cavity surface-emitting laser arrays with redundancy
description	This paper describes theoretical reliability analysis of a system containing n optical ports in which each optical port contains m redundant vertical-cavity surface-emitting lasers. We study the wearout failure statistics, modelled with lognormal distribution, for three different chip-level integration approaches: (A) each laser on its own chip, resulting in m·n chips, (B) m redundant lasers associated with one channel are on a single chip, resulting in n chips, and (C) all m·n lasers integrated on a single chip. We present a model that includes the run-to-run reliability parameter fluctuation and find that the three integration schemes consistently exhibit MTTF(C) ≥ MTTF(A) ≥ MTTF(B) for lognormal distribution shape parameters observed in commercial vertical-cavity surface-emitting lasers. We also provide analytic approximations for the failure statistics for all three integration approaches enabling straightforward calculation of the failure statistics for any redundancy and channel number.
format	article
author	Dubravko Babić
author_facet	Dubravko Babić
author_sort	Dubravko Babić
title	Reliability of vertical-cavity surface-emitting laser arrays with redundancy
title_short	Reliability of vertical-cavity surface-emitting laser arrays with redundancy
title_full	Reliability of vertical-cavity surface-emitting laser arrays with redundancy
title_fullStr	Reliability of vertical-cavity surface-emitting laser arrays with redundancy
title_full_unstemmed	Reliability of vertical-cavity surface-emitting laser arrays with redundancy
title_sort	reliability of vertical-cavity surface-emitting laser arrays with redundancy
publisher	Taylor & Francis Group
publishDate	2021
url	https://doaj.org/article/848f614c5f974268a7285c9cdb686365
work_keys_str_mv	AT dubravkobabic reliabilityofverticalcavitysurfaceemittinglaserarrayswithredundancy
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Reliability of vertical-cavity surface-emitting laser arrays with redundancy

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