Reliability of vertical-cavity surface-emitting laser arrays with redundancy
This paper describes theoretical reliability analysis of a system containing n optical ports in which each optical port contains m redundant vertical-cavity surface-emitting lasers. We study the wearout failure statistics, modelled with lognormal distribution, for three different chip-level integrat...
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Taylor & Francis Group
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/848f614c5f974268a7285c9cdb686365 |
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