A random-walk benchmark for single-electron circuits

Fidelity control is important to quantum metrology and fault-tolerant quantum computation. Here, authors realize clock-controlled transfer of electrons through quantum dots and describe the statistics of accumulated charge by a random-walk model, achieving a benchmark for single-electron circuits.

Guardado en:

Detalles Bibliográficos
Autores principales:	David Reifert, Martins Kokainis, Andris Ambainis, Vyacheslavs Kashcheyevs, Niels Ubbelohde
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2021
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/86c79193df4a41e0b420cf1e26db3ece
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

id	oai:doaj.org-article:86c79193df4a41e0b420cf1e26db3ece
record_format	dspace
spelling	oai:doaj.org-article:86c79193df4a41e0b420cf1e26db3ece2021-12-02T14:01:15ZA random-walk benchmark for single-electron circuits10.1038/s41467-020-20554-w2041-1723https://doaj.org/article/86c79193df4a41e0b420cf1e26db3ece2021-01-01T00:00:00Zhttps://doi.org/10.1038/s41467-020-20554-whttps://doaj.org/toc/2041-1723Fidelity control is important to quantum metrology and fault-tolerant quantum computation. Here, authors realize clock-controlled transfer of electrons through quantum dots and describe the statistics of accumulated charge by a random-walk model, achieving a benchmark for single-electron circuits.David ReifertMartins KokainisAndris AmbainisVyacheslavs KashcheyevsNiels UbbelohdeNature PortfolioarticleScienceQENNature Communications, Vol 12, Iss 1, Pp 1-7 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q David Reifert Martins Kokainis Andris Ambainis Vyacheslavs Kashcheyevs Niels Ubbelohde A random-walk benchmark for single-electron circuits
description	Fidelity control is important to quantum metrology and fault-tolerant quantum computation. Here, authors realize clock-controlled transfer of electrons through quantum dots and describe the statistics of accumulated charge by a random-walk model, achieving a benchmark for single-electron circuits.
format	article
author	David Reifert Martins Kokainis Andris Ambainis Vyacheslavs Kashcheyevs Niels Ubbelohde
author_facet	David Reifert Martins Kokainis Andris Ambainis Vyacheslavs Kashcheyevs Niels Ubbelohde
author_sort	David Reifert
title	A random-walk benchmark for single-electron circuits
title_short	A random-walk benchmark for single-electron circuits
title_full	A random-walk benchmark for single-electron circuits
title_fullStr	A random-walk benchmark for single-electron circuits
title_full_unstemmed	A random-walk benchmark for single-electron circuits
title_sort	random-walk benchmark for single-electron circuits
publisher	Nature Portfolio
publishDate	2021
url	https://doaj.org/article/86c79193df4a41e0b420cf1e26db3ece
work_keys_str_mv	AT davidreifert arandomwalkbenchmarkforsingleelectroncircuits AT martinskokainis arandomwalkbenchmarkforsingleelectroncircuits AT andrisambainis arandomwalkbenchmarkforsingleelectroncircuits AT vyacheslavskashcheyevs arandomwalkbenchmarkforsingleelectroncircuits AT nielsubbelohde arandomwalkbenchmarkforsingleelectroncircuits AT davidreifert randomwalkbenchmarkforsingleelectroncircuits AT martinskokainis randomwalkbenchmarkforsingleelectroncircuits AT andrisambainis randomwalkbenchmarkforsingleelectroncircuits AT vyacheslavskashcheyevs randomwalkbenchmarkforsingleelectroncircuits AT nielsubbelohde randomwalkbenchmarkforsingleelectroncircuits
_version_	1718392210955698176

A random-walk benchmark for single-electron circuits

Ejemplares similares