Comparison of Camera Calibration and Measurement Accuracy Techniques for Phase Measuring Deflectometry

Phase measuring deflectometry (PMD) is a competitive method for specular surface measurement that offers the advantages of a high dynamic range, non-contact process, and full field measurement; furthermore, it can also achieve high accuracy. Camera calibration is a crucial step for PMD. As a result,...

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Autores principales: Renhao Ge, Dahai Li, Xinwei Zhang, Ruiyang Wang, Wanxing Zheng, Xiaowei Li, Wuxiang Zhao
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Lenguaje:EN
Publicado: MDPI AG 2021
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Acceso en línea:https://doaj.org/article/878ebff8753d4f8f8f0fbeb90aec9e07
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spelling oai:doaj.org-article:878ebff8753d4f8f8f0fbeb90aec9e072021-11-11T15:19:49ZComparison of Camera Calibration and Measurement Accuracy Techniques for Phase Measuring Deflectometry10.3390/app1121103002076-3417https://doaj.org/article/878ebff8753d4f8f8f0fbeb90aec9e072021-11-01T00:00:00Zhttps://www.mdpi.com/2076-3417/11/21/10300https://doaj.org/toc/2076-3417Phase measuring deflectometry (PMD) is a competitive method for specular surface measurement that offers the advantages of a high dynamic range, non-contact process, and full field measurement; furthermore, it can also achieve high accuracy. Camera calibration is a crucial step for PMD. As a result, a method based on the calibration of the entrance pupil center is introduced in this paper. Then, our proposed approach is compared with the most popular photogrammetric method based on Zhang’s technique (PM) and Huang’s modal phase measuring deflectometry (MPMD). The calibration procedures of these three methods are described, and the measurement errors introduced by the perturbations of degrees of freedom in the PMD system are analyzed using a ray tracing technique. In the experiment, a planar window glass and an optical planar element are separately measured, and the measurement results of the use of the three methods are compared. The experimental results for the optical planar element (removing the first 6 terms of the Zernike polynomial) show that our method’s measurement accuracy reached 13.71 nm RMS and 80.50 nm PV, which is comparable to accuracy values for the interferometer.Renhao GeDahai LiXinwei ZhangRuiyang WangWanxing ZhengXiaowei LiWuxiang ZhaoMDPI AGarticlephase measuring deflectometryentrance pupil centercamera calibrationsurface shapeTechnologyTEngineering (General). Civil engineering (General)TA1-2040Biology (General)QH301-705.5PhysicsQC1-999ChemistryQD1-999ENApplied Sciences, Vol 11, Iss 10300, p 10300 (2021)
institution DOAJ
collection DOAJ
language EN
topic phase measuring deflectometry
entrance pupil center
camera calibration
surface shape
Technology
T
Engineering (General). Civil engineering (General)
TA1-2040
Biology (General)
QH301-705.5
Physics
QC1-999
Chemistry
QD1-999
spellingShingle phase measuring deflectometry
entrance pupil center
camera calibration
surface shape
Technology
T
Engineering (General). Civil engineering (General)
TA1-2040
Biology (General)
QH301-705.5
Physics
QC1-999
Chemistry
QD1-999
Renhao Ge
Dahai Li
Xinwei Zhang
Ruiyang Wang
Wanxing Zheng
Xiaowei Li
Wuxiang Zhao
Comparison of Camera Calibration and Measurement Accuracy Techniques for Phase Measuring Deflectometry
description Phase measuring deflectometry (PMD) is a competitive method for specular surface measurement that offers the advantages of a high dynamic range, non-contact process, and full field measurement; furthermore, it can also achieve high accuracy. Camera calibration is a crucial step for PMD. As a result, a method based on the calibration of the entrance pupil center is introduced in this paper. Then, our proposed approach is compared with the most popular photogrammetric method based on Zhang’s technique (PM) and Huang’s modal phase measuring deflectometry (MPMD). The calibration procedures of these three methods are described, and the measurement errors introduced by the perturbations of degrees of freedom in the PMD system are analyzed using a ray tracing technique. In the experiment, a planar window glass and an optical planar element are separately measured, and the measurement results of the use of the three methods are compared. The experimental results for the optical planar element (removing the first 6 terms of the Zernike polynomial) show that our method’s measurement accuracy reached 13.71 nm RMS and 80.50 nm PV, which is comparable to accuracy values for the interferometer.
format article
author Renhao Ge
Dahai Li
Xinwei Zhang
Ruiyang Wang
Wanxing Zheng
Xiaowei Li
Wuxiang Zhao
author_facet Renhao Ge
Dahai Li
Xinwei Zhang
Ruiyang Wang
Wanxing Zheng
Xiaowei Li
Wuxiang Zhao
author_sort Renhao Ge
title Comparison of Camera Calibration and Measurement Accuracy Techniques for Phase Measuring Deflectometry
title_short Comparison of Camera Calibration and Measurement Accuracy Techniques for Phase Measuring Deflectometry
title_full Comparison of Camera Calibration and Measurement Accuracy Techniques for Phase Measuring Deflectometry
title_fullStr Comparison of Camera Calibration and Measurement Accuracy Techniques for Phase Measuring Deflectometry
title_full_unstemmed Comparison of Camera Calibration and Measurement Accuracy Techniques for Phase Measuring Deflectometry
title_sort comparison of camera calibration and measurement accuracy techniques for phase measuring deflectometry
publisher MDPI AG
publishDate 2021
url https://doaj.org/article/878ebff8753d4f8f8f0fbeb90aec9e07
work_keys_str_mv AT renhaoge comparisonofcameracalibrationandmeasurementaccuracytechniquesforphasemeasuringdeflectometry
AT dahaili comparisonofcameracalibrationandmeasurementaccuracytechniquesforphasemeasuringdeflectometry
AT xinweizhang comparisonofcameracalibrationandmeasurementaccuracytechniquesforphasemeasuringdeflectometry
AT ruiyangwang comparisonofcameracalibrationandmeasurementaccuracytechniquesforphasemeasuringdeflectometry
AT wanxingzheng comparisonofcameracalibrationandmeasurementaccuracytechniquesforphasemeasuringdeflectometry
AT xiaoweili comparisonofcameracalibrationandmeasurementaccuracytechniquesforphasemeasuringdeflectometry
AT wuxiangzhao comparisonofcameracalibrationandmeasurementaccuracytechniquesforphasemeasuringdeflectometry
_version_ 1718435377105076224