In situ microbeam surface X-ray scattering reveals alternating step kinetics during crystal growth

The basal-plane surfaces of hexagonal close-packed crystals typically exhibit an alternating sequence of A and B steps with different atomic structures and growth kinetics. Here the authors demonstrate a method to determine whether A or B steps have faster kinetics under specific growth conditions.

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Autores principales: Guangxu Ju, Dongwei Xu, Carol Thompson, Matthew J. Highland, Jeffrey A. Eastman, Weronika Walkosz, Peter Zapol, G. Brian Stephenson
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/8e0d27f7d3f347c393a31e70baee141b
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spelling oai:doaj.org-article:8e0d27f7d3f347c393a31e70baee141b2021-12-02T11:39:46ZIn situ microbeam surface X-ray scattering reveals alternating step kinetics during crystal growth10.1038/s41467-021-21927-52041-1723https://doaj.org/article/8e0d27f7d3f347c393a31e70baee141b2021-03-01T00:00:00Zhttps://doi.org/10.1038/s41467-021-21927-5https://doaj.org/toc/2041-1723The basal-plane surfaces of hexagonal close-packed crystals typically exhibit an alternating sequence of A and B steps with different atomic structures and growth kinetics. Here the authors demonstrate a method to determine whether A or B steps have faster kinetics under specific growth conditions.Guangxu JuDongwei XuCarol ThompsonMatthew J. HighlandJeffrey A. EastmanWeronika WalkoszPeter ZapolG. Brian StephensonNature PortfolioarticleScienceQENNature Communications, Vol 12, Iss 1, Pp 1-10 (2021)
institution DOAJ
collection DOAJ
language EN
topic Science
Q
spellingShingle Science
Q
Guangxu Ju
Dongwei Xu
Carol Thompson
Matthew J. Highland
Jeffrey A. Eastman
Weronika Walkosz
Peter Zapol
G. Brian Stephenson
In situ microbeam surface X-ray scattering reveals alternating step kinetics during crystal growth
description The basal-plane surfaces of hexagonal close-packed crystals typically exhibit an alternating sequence of A and B steps with different atomic structures and growth kinetics. Here the authors demonstrate a method to determine whether A or B steps have faster kinetics under specific growth conditions.
format article
author Guangxu Ju
Dongwei Xu
Carol Thompson
Matthew J. Highland
Jeffrey A. Eastman
Weronika Walkosz
Peter Zapol
G. Brian Stephenson
author_facet Guangxu Ju
Dongwei Xu
Carol Thompson
Matthew J. Highland
Jeffrey A. Eastman
Weronika Walkosz
Peter Zapol
G. Brian Stephenson
author_sort Guangxu Ju
title In situ microbeam surface X-ray scattering reveals alternating step kinetics during crystal growth
title_short In situ microbeam surface X-ray scattering reveals alternating step kinetics during crystal growth
title_full In situ microbeam surface X-ray scattering reveals alternating step kinetics during crystal growth
title_fullStr In situ microbeam surface X-ray scattering reveals alternating step kinetics during crystal growth
title_full_unstemmed In situ microbeam surface X-ray scattering reveals alternating step kinetics during crystal growth
title_sort in situ microbeam surface x-ray scattering reveals alternating step kinetics during crystal growth
publisher Nature Portfolio
publishDate 2021
url https://doaj.org/article/8e0d27f7d3f347c393a31e70baee141b
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AT matthewjhighland insitumicrobeamsurfacexrayscatteringrevealsalternatingstepkineticsduringcrystalgrowth
AT jeffreyaeastman insitumicrobeamsurfacexrayscatteringrevealsalternatingstepkineticsduringcrystalgrowth
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AT gbrianstephenson insitumicrobeamsurfacexrayscatteringrevealsalternatingstepkineticsduringcrystalgrowth
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