Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays

This paper presents automatic fault detection circuit for integrated gate drivers. The proposed circuit consists of one capacitor and two TFTs per scan line. The circuit can detect three types of faults, such as line disconnection (LD), low voltage stuck (LVS), and high voltage stuck (HVS) for the g...

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Autores principales:	Byung-Chang Yu, Jongbin Kim, Seung-Hyuck Lee, Hoon-Ju Chung, Seung-Woo Lee
Formato:	article
Lenguaje:	EN
Publicado:	IEEE 2019
Materias:	Fault detection stretchable display gate driver circuits Electrical engineering. Electronics. Nuclear engineering TK1-9971
Acceso en línea:	https://doaj.org/article/8e2010106c1540f0b17771a7c13108c9
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id	oai:doaj.org-article:8e2010106c1540f0b17771a7c13108c9
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spelling	oai:doaj.org-article:8e2010106c1540f0b17771a7c13108c92021-11-19T00:00:50ZAutomatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays2168-673410.1109/JEDS.2018.2885529https://doaj.org/article/8e2010106c1540f0b17771a7c13108c92019-01-01T00:00:00Zhttps://ieeexplore.ieee.org/document/8567987/https://doaj.org/toc/2168-6734This paper presents automatic fault detection circuit for integrated gate drivers. The proposed circuit consists of one capacitor and two TFTs per scan line. The circuit can detect three types of faults, such as line disconnection (LD), low voltage stuck (LVS), and high voltage stuck (HVS) for the gate driver due to external physical stress. Simulation results showed the proposed circuit operates well. In order to verify the circuit operation, it was fabricated with indium gallium zinc oxide thin film transistors process. The measurement results also verified that our proposed fault detection circuit could detect the types and locations of the LD and LVS of the gate driver successfully. However, we found that HVS can be detected, but further study is needed to accurately detect the position of HVS in the proposed circuit.Byung-Chang YuJongbin KimSeung-Hyuck LeeHoon-Ju ChungSeung-Woo LeeIEEEarticleFault detectionstretchable displaygate driver circuitsElectrical engineering. Electronics. Nuclear engineeringTK1-9971ENIEEE Journal of the Electron Devices Society, Vol 7, Pp 315-321 (2019)
institution	DOAJ
collection	DOAJ
language	EN
topic	Fault detection stretchable display gate driver circuits Electrical engineering. Electronics. Nuclear engineering TK1-9971
spellingShingle	Fault detection stretchable display gate driver circuits Electrical engineering. Electronics. Nuclear engineering TK1-9971 Byung-Chang Yu Jongbin Kim Seung-Hyuck Lee Hoon-Ju Chung Seung-Woo Lee Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays
description	This paper presents automatic fault detection circuit for integrated gate drivers. The proposed circuit consists of one capacitor and two TFTs per scan line. The circuit can detect three types of faults, such as line disconnection (LD), low voltage stuck (LVS), and high voltage stuck (HVS) for the gate driver due to external physical stress. Simulation results showed the proposed circuit operates well. In order to verify the circuit operation, it was fabricated with indium gallium zinc oxide thin film transistors process. The measurement results also verified that our proposed fault detection circuit could detect the types and locations of the LD and LVS of the gate driver successfully. However, we found that HVS can be detected, but further study is needed to accurately detect the position of HVS in the proposed circuit.
format	article
author	Byung-Chang Yu Jongbin Kim Seung-Hyuck Lee Hoon-Ju Chung Seung-Woo Lee
author_facet	Byung-Chang Yu Jongbin Kim Seung-Hyuck Lee Hoon-Ju Chung Seung-Woo Lee
author_sort	Byung-Chang Yu
title	Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays
title_short	Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays
title_full	Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays
title_fullStr	Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays
title_full_unstemmed	Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays
title_sort	automatic fault detection circuit for integrated gate drivers of active-matrix displays
publisher	IEEE
publishDate	2019
url	https://doaj.org/article/8e2010106c1540f0b17771a7c13108c9
work_keys_str_mv	AT byungchangyu automaticfaultdetectioncircuitforintegratedgatedriversofactivematrixdisplays AT jongbinkim automaticfaultdetectioncircuitforintegratedgatedriversofactivematrixdisplays AT seunghyucklee automaticfaultdetectioncircuitforintegratedgatedriversofactivematrixdisplays AT hoonjuchung automaticfaultdetectioncircuitforintegratedgatedriversofactivematrixdisplays AT seungwoolee automaticfaultdetectioncircuitforintegratedgatedriversofactivematrixdisplays
_version_	1718420678786416640

Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays

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