Cita APA (7a ed.)

Fan, W., Liu, P., Kuo, P., Chang, C., Liu, I., & Kuo, Y. (2021). Numerical Analysis of Oxygen-Related Defects in Amorphous In-W-O Nanosheet Thin-Film Transistor. MDPI AG.

Cita Chicago Style (17a ed.)

Fan, Wan-Ta, Po-Tsun Liu, Po-Yi Kuo, Chien-Min Chang, I-Han Liu, y Yue Kuo. Numerical Analysis of Oxygen-Related Defects in Amorphous In-W-O Nanosheet Thin-Film Transistor. MDPI AG, 2021.

Cita MLA (8a ed.)

Fan, Wan-Ta, et al. Numerical Analysis of Oxygen-Related Defects in Amorphous In-W-O Nanosheet Thin-Film Transistor. MDPI AG, 2021.

Precaución: Estas citas no son 100% exactas.