Fan, W., Liu, P., Kuo, P., Chang, C., Liu, I., & Kuo, Y. (2021). Numerical Analysis of Oxygen-Related Defects in Amorphous In-W-O Nanosheet Thin-Film Transistor. MDPI AG.
Cita Chicago Style (17a ed.)Fan, Wan-Ta, Po-Tsun Liu, Po-Yi Kuo, Chien-Min Chang, I-Han Liu, y Yue Kuo. Numerical Analysis of Oxygen-Related Defects in Amorphous In-W-O Nanosheet Thin-Film Transistor. MDPI AG, 2021.
Cita MLA (8a ed.)Fan, Wan-Ta, et al. Numerical Analysis of Oxygen-Related Defects in Amorphous In-W-O Nanosheet Thin-Film Transistor. MDPI AG, 2021.
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