Application of dynamic adaptive technology based on symbolic regression to identify modal parameters of chip sorter

Cantilever structure, which needs high-frequency rotating motion, is widely used in the field of chip manufacturing. The motion stability of high-frequency rotation motion of cantilever structure directly affects the production efficiency. The traditional dynamic analysis method is no longer applica...

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Autores principales: Xuchu Jiang, Hu Zhang, Ying Li, Biao Zhang
Formato: article
Lenguaje:EN
Publicado: JVE International 2021
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Acceso en línea:https://doaj.org/article/90d6b6a1c7b54610950f81e030b2184c
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spelling oai:doaj.org-article:90d6b6a1c7b54610950f81e030b2184c2021-11-15T19:20:56ZApplication of dynamic adaptive technology based on symbolic regression to identify modal parameters of chip sorter1392-87162538-846010.21595/jve.2021.21783https://doaj.org/article/90d6b6a1c7b54610950f81e030b2184c2021-09-01T00:00:00Zhttps://www.jvejournals.com/article/21783https://doaj.org/toc/1392-8716https://doaj.org/toc/2538-8460Cantilever structure, which needs high-frequency rotating motion, is widely used in the field of chip manufacturing. The motion stability of high-frequency rotation motion of cantilever structure directly affects the production efficiency. The traditional dynamic analysis method is no longer applicable to analyze the vibration of cantilever structure under high-frequency rotating motion. It is also urgent to control the high-frequency rotation motion of cantilever mechanism. In this paper, experiments are designed to collect strain signals of chip sorter’s cantilever under high-frequency operation, and modal parameters are extracted from time domain signals by symbolic regression algorithm. The results of modal parameter identification at high-frequency are selected as the samples, and the Gaussian process regression model of machine learning algorithm is used to train the samples. The prediction results can be used as the basis of structural stability research and vibration suppression.Xuchu JiangHu ZhangYing LiBiao ZhangJVE Internationalarticlehigh-frequency rotational motionmodal analysisstrain responsesymbolic regressiondynamic adaptive technologymain vibration frequencyMechanical engineering and machineryTJ1-1570ENJournal of Vibroengineering, Vol 23, Iss 7, Pp 1652-1662 (2021)
institution DOAJ
collection DOAJ
language EN
topic high-frequency rotational motion
modal analysis
strain response
symbolic regression
dynamic adaptive technology
main vibration frequency
Mechanical engineering and machinery
TJ1-1570
spellingShingle high-frequency rotational motion
modal analysis
strain response
symbolic regression
dynamic adaptive technology
main vibration frequency
Mechanical engineering and machinery
TJ1-1570
Xuchu Jiang
Hu Zhang
Ying Li
Biao Zhang
Application of dynamic adaptive technology based on symbolic regression to identify modal parameters of chip sorter
description Cantilever structure, which needs high-frequency rotating motion, is widely used in the field of chip manufacturing. The motion stability of high-frequency rotation motion of cantilever structure directly affects the production efficiency. The traditional dynamic analysis method is no longer applicable to analyze the vibration of cantilever structure under high-frequency rotating motion. It is also urgent to control the high-frequency rotation motion of cantilever mechanism. In this paper, experiments are designed to collect strain signals of chip sorter’s cantilever under high-frequency operation, and modal parameters are extracted from time domain signals by symbolic regression algorithm. The results of modal parameter identification at high-frequency are selected as the samples, and the Gaussian process regression model of machine learning algorithm is used to train the samples. The prediction results can be used as the basis of structural stability research and vibration suppression.
format article
author Xuchu Jiang
Hu Zhang
Ying Li
Biao Zhang
author_facet Xuchu Jiang
Hu Zhang
Ying Li
Biao Zhang
author_sort Xuchu Jiang
title Application of dynamic adaptive technology based on symbolic regression to identify modal parameters of chip sorter
title_short Application of dynamic adaptive technology based on symbolic regression to identify modal parameters of chip sorter
title_full Application of dynamic adaptive technology based on symbolic regression to identify modal parameters of chip sorter
title_fullStr Application of dynamic adaptive technology based on symbolic regression to identify modal parameters of chip sorter
title_full_unstemmed Application of dynamic adaptive technology based on symbolic regression to identify modal parameters of chip sorter
title_sort application of dynamic adaptive technology based on symbolic regression to identify modal parameters of chip sorter
publisher JVE International
publishDate 2021
url https://doaj.org/article/90d6b6a1c7b54610950f81e030b2184c
work_keys_str_mv AT xuchujiang applicationofdynamicadaptivetechnologybasedonsymbolicregressiontoidentifymodalparametersofchipsorter
AT huzhang applicationofdynamicadaptivetechnologybasedonsymbolicregressiontoidentifymodalparametersofchipsorter
AT yingli applicationofdynamicadaptivetechnologybasedonsymbolicregressiontoidentifymodalparametersofchipsorter
AT biaozhang applicationofdynamicadaptivetechnologybasedonsymbolicregressiontoidentifymodalparametersofchipsorter
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