Dynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy

Photo-assisted Ultrafast Scanning Electron Microscopy (USEM) maps the dynamics of surface photovoltages and local electric fields in semiconducting samples. Photovoltages and their gradients close to surface affect the emission yield and the detection efficiency of secondary electrons (SE), leading...

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Autores principales:	Zaghloul Mohamed, Pietralunga Silvia M., Irde Gabriele, Sala Vittorio, Cerullo Giulio, Chen Hao, Isella Giovanni, Lanzani Guglielmo, Zani Maurizio, Tagliaferri Alberto
Formato:	article
Lenguaje:	EN
Publicado:	EDP Sciences 2021
Materias:	Physics QC1-999
Acceso en línea:	https://doaj.org/article/90f200dea8534e368c5c215fbba2fb22
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spelling	oai:doaj.org-article:90f200dea8534e368c5c215fbba2fb222021-12-02T17:12:51ZDynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy2100-014X10.1051/epjconf/202125511001https://doaj.org/article/90f200dea8534e368c5c215fbba2fb222021-01-01T00:00:00Zhttps://www.epj-conferences.org/articles/epjconf/pdf/2021/09/epjconf_eosam2021_11001.pdfhttps://doaj.org/toc/2100-014XPhoto-assisted Ultrafast Scanning Electron Microscopy (USEM) maps the dynamics of surface photovoltages and local electric fields in semiconducting samples. Photovoltages and their gradients close to surface affect the emission yield and the detection efficiency of secondary electrons (SE), leading to photoexcited SE 2D patterns. In this work, we present a method to characterize the evolution of the patterns up to ultrafast regime. These results reveal the role of surface states in affecting the external field dynamics at picoseconds. Moreover, we show that tiny changes in surface preparation express deeply different photoexcited voltage signals. We investigate the relation between the surface chemistry of Si and photo-induced SE contrast.Zaghloul MohamedPietralunga Silvia M.Irde GabrieleSala VittorioCerullo GiulioChen HaoIsella GiovanniLanzani GuglielmoZani MaurizioTagliaferri AlbertoEDP SciencesarticlePhysicsQC1-999ENEPJ Web of Conferences, Vol 255, p 11001 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Physics QC1-999
spellingShingle	Physics QC1-999 Zaghloul Mohamed Pietralunga Silvia M. Irde Gabriele Sala Vittorio Cerullo Giulio Chen Hao Isella Giovanni Lanzani Guglielmo Zani Maurizio Tagliaferri Alberto Dynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy
description	Photo-assisted Ultrafast Scanning Electron Microscopy (USEM) maps the dynamics of surface photovoltages and local electric fields in semiconducting samples. Photovoltages and their gradients close to surface affect the emission yield and the detection efficiency of secondary electrons (SE), leading to photoexcited SE 2D patterns. In this work, we present a method to characterize the evolution of the patterns up to ultrafast regime. These results reveal the role of surface states in affecting the external field dynamics at picoseconds. Moreover, we show that tiny changes in surface preparation express deeply different photoexcited voltage signals. We investigate the relation between the surface chemistry of Si and photo-induced SE contrast.
format	article
author	Zaghloul Mohamed Pietralunga Silvia M. Irde Gabriele Sala Vittorio Cerullo Giulio Chen Hao Isella Giovanni Lanzani Guglielmo Zani Maurizio Tagliaferri Alberto
author_facet	Zaghloul Mohamed Pietralunga Silvia M. Irde Gabriele Sala Vittorio Cerullo Giulio Chen Hao Isella Giovanni Lanzani Guglielmo Zani Maurizio Tagliaferri Alberto
author_sort	Zaghloul Mohamed
title	Dynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy
title_short	Dynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy
title_full	Dynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy
title_fullStr	Dynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy
title_full_unstemmed	Dynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy
title_sort	dynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy
publisher	EDP Sciences
publishDate	2021
url	https://doaj.org/article/90f200dea8534e368c5c215fbba2fb22
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Dynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy

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