Comprehensive Study of Stacked Nanosheet-Type Channel Based on Junctionless Gate-All-Around Thin-Film Transistors
As technology develops, the stacked nanosheet (NS) structure demonstrates promise for use in future technology nodes. This study demonstrated the excellent performance of stacked-NS channels with junctionless gate-all-around thin-film transistors and compared the electrical characteristics of single...
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Auteurs principaux: | Yu-Ru Lin, Yu-Hsien Lin, Yi-Yun Yang, Yung-Chun Wu |
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Format: | article |
Langue: | EN |
Publié: |
IEEE
2019
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Sujets: | |
Accès en ligne: | https://doaj.org/article/91bfabc34f474cfeb3a50c2a484d8f87 |
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