Comprehensive Study of Stacked Nanosheet-Type Channel Based on Junctionless Gate-All-Around Thin-Film Transistors

As technology develops, the stacked nanosheet (NS) structure demonstrates promise for use in future technology nodes. This study demonstrated the excellent performance of stacked-NS channels with junctionless gate-all-around thin-film transistors and compared the electrical characteristics of single...

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Auteurs principaux: Yu-Ru Lin, Yu-Hsien Lin, Yi-Yun Yang, Yung-Chun Wu
Format: article
Langue:EN
Publié: IEEE 2019
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Accès en ligne:https://doaj.org/article/91bfabc34f474cfeb3a50c2a484d8f87
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