Atomic resolution electron microscopy in a magnetic field free environment

Electron microscopy typically requires strong magnetic lenses in order to reach atomic resolution, prohibiting the possibility to measure magnetic materials. The authors here present a lens design that enables atomic-resolution electron microscopy of magnetic materials by providing a field-free samp...

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Autores principales: N. Shibata, Y. Kohno, A. Nakamura, S. Morishita, T. Seki, A. Kumamoto, H. Sawada, T. Matsumoto, S. D. Findlay, Y. Ikuhara
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2019
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Acceso en línea:https://doaj.org/article/93ddd7a9cc58420097f10420d2afc6e8
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spelling oai:doaj.org-article:93ddd7a9cc58420097f10420d2afc6e82021-12-02T17:32:09ZAtomic resolution electron microscopy in a magnetic field free environment10.1038/s41467-019-10281-22041-1723https://doaj.org/article/93ddd7a9cc58420097f10420d2afc6e82019-05-01T00:00:00Zhttps://doi.org/10.1038/s41467-019-10281-2https://doaj.org/toc/2041-1723Electron microscopy typically requires strong magnetic lenses in order to reach atomic resolution, prohibiting the possibility to measure magnetic materials. The authors here present a lens design that enables atomic-resolution electron microscopy of magnetic materials by providing a field-free sample region.N. ShibataY. KohnoA. NakamuraS. MorishitaT. SekiA. KumamotoH. SawadaT. MatsumotoS. D. FindlayY. IkuharaNature PortfolioarticleScienceQENNature Communications, Vol 10, Iss 1, Pp 1-5 (2019)
institution DOAJ
collection DOAJ
language EN
topic Science
Q
spellingShingle Science
Q
N. Shibata
Y. Kohno
A. Nakamura
S. Morishita
T. Seki
A. Kumamoto
H. Sawada
T. Matsumoto
S. D. Findlay
Y. Ikuhara
Atomic resolution electron microscopy in a magnetic field free environment
description Electron microscopy typically requires strong magnetic lenses in order to reach atomic resolution, prohibiting the possibility to measure magnetic materials. The authors here present a lens design that enables atomic-resolution electron microscopy of magnetic materials by providing a field-free sample region.
format article
author N. Shibata
Y. Kohno
A. Nakamura
S. Morishita
T. Seki
A. Kumamoto
H. Sawada
T. Matsumoto
S. D. Findlay
Y. Ikuhara
author_facet N. Shibata
Y. Kohno
A. Nakamura
S. Morishita
T. Seki
A. Kumamoto
H. Sawada
T. Matsumoto
S. D. Findlay
Y. Ikuhara
author_sort N. Shibata
title Atomic resolution electron microscopy in a magnetic field free environment
title_short Atomic resolution electron microscopy in a magnetic field free environment
title_full Atomic resolution electron microscopy in a magnetic field free environment
title_fullStr Atomic resolution electron microscopy in a magnetic field free environment
title_full_unstemmed Atomic resolution electron microscopy in a magnetic field free environment
title_sort atomic resolution electron microscopy in a magnetic field free environment
publisher Nature Portfolio
publishDate 2019
url https://doaj.org/article/93ddd7a9cc58420097f10420d2afc6e8
work_keys_str_mv AT nshibata atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment
AT ykohno atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment
AT anakamura atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment
AT smorishita atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment
AT tseki atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment
AT akumamoto atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment
AT hsawada atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment
AT tmatsumoto atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment
AT sdfindlay atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment
AT yikuhara atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment
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