Atomic resolution electron microscopy in a magnetic field free environment
Electron microscopy typically requires strong magnetic lenses in order to reach atomic resolution, prohibiting the possibility to measure magnetic materials. The authors here present a lens design that enables atomic-resolution electron microscopy of magnetic materials by providing a field-free samp...
Guardado en:
Autores principales: | , , , , , , , , , |
---|---|
Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2019
|
Materias: | |
Acceso en línea: | https://doaj.org/article/93ddd7a9cc58420097f10420d2afc6e8 |
Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
id |
oai:doaj.org-article:93ddd7a9cc58420097f10420d2afc6e8 |
---|---|
record_format |
dspace |
spelling |
oai:doaj.org-article:93ddd7a9cc58420097f10420d2afc6e82021-12-02T17:32:09ZAtomic resolution electron microscopy in a magnetic field free environment10.1038/s41467-019-10281-22041-1723https://doaj.org/article/93ddd7a9cc58420097f10420d2afc6e82019-05-01T00:00:00Zhttps://doi.org/10.1038/s41467-019-10281-2https://doaj.org/toc/2041-1723Electron microscopy typically requires strong magnetic lenses in order to reach atomic resolution, prohibiting the possibility to measure magnetic materials. The authors here present a lens design that enables atomic-resolution electron microscopy of magnetic materials by providing a field-free sample region.N. ShibataY. KohnoA. NakamuraS. MorishitaT. SekiA. KumamotoH. SawadaT. MatsumotoS. D. FindlayY. IkuharaNature PortfolioarticleScienceQENNature Communications, Vol 10, Iss 1, Pp 1-5 (2019) |
institution |
DOAJ |
collection |
DOAJ |
language |
EN |
topic |
Science Q |
spellingShingle |
Science Q N. Shibata Y. Kohno A. Nakamura S. Morishita T. Seki A. Kumamoto H. Sawada T. Matsumoto S. D. Findlay Y. Ikuhara Atomic resolution electron microscopy in a magnetic field free environment |
description |
Electron microscopy typically requires strong magnetic lenses in order to reach atomic resolution, prohibiting the possibility to measure magnetic materials. The authors here present a lens design that enables atomic-resolution electron microscopy of magnetic materials by providing a field-free sample region. |
format |
article |
author |
N. Shibata Y. Kohno A. Nakamura S. Morishita T. Seki A. Kumamoto H. Sawada T. Matsumoto S. D. Findlay Y. Ikuhara |
author_facet |
N. Shibata Y. Kohno A. Nakamura S. Morishita T. Seki A. Kumamoto H. Sawada T. Matsumoto S. D. Findlay Y. Ikuhara |
author_sort |
N. Shibata |
title |
Atomic resolution electron microscopy in a magnetic field free environment |
title_short |
Atomic resolution electron microscopy in a magnetic field free environment |
title_full |
Atomic resolution electron microscopy in a magnetic field free environment |
title_fullStr |
Atomic resolution electron microscopy in a magnetic field free environment |
title_full_unstemmed |
Atomic resolution electron microscopy in a magnetic field free environment |
title_sort |
atomic resolution electron microscopy in a magnetic field free environment |
publisher |
Nature Portfolio |
publishDate |
2019 |
url |
https://doaj.org/article/93ddd7a9cc58420097f10420d2afc6e8 |
work_keys_str_mv |
AT nshibata atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment AT ykohno atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment AT anakamura atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment AT smorishita atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment AT tseki atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment AT akumamoto atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment AT hsawada atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment AT tmatsumoto atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment AT sdfindlay atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment AT yikuhara atomicresolutionelectronmicroscopyinamagneticfieldfreeenvironment |
_version_ |
1718380383738789888 |