Atomic resolution electron microscopy in a magnetic field free environment
Electron microscopy typically requires strong magnetic lenses in order to reach atomic resolution, prohibiting the possibility to measure magnetic materials. The authors here present a lens design that enables atomic-resolution electron microscopy of magnetic materials by providing a field-free samp...
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Autores principales: | N. Shibata, Y. Kohno, A. Nakamura, S. Morishita, T. Seki, A. Kumamoto, H. Sawada, T. Matsumoto, S. D. Findlay, Y. Ikuhara |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2019
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Materias: | |
Acceso en línea: | https://doaj.org/article/93ddd7a9cc58420097f10420d2afc6e8 |
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