Annealing effect on temperature stability and mechanical stress at the “CdxPb1−xS film – substrate” interface

The article establishes the upper temperature steadiness limit of СdxPb1-xS supersaturated solid solutions obtained by chemical bath deposition. СdxPb1-xS (x = 0.06; 0.122; 0.176) and (x = 0.02–0.05) films remained stable under the heating up to 405–410 and 450 K, respectively. SEM studies have show...

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Autores principales: L. N. Maskaeva, A. D. Kutyavina, A. V. Pozdin, B. N. Miroshnikov, I. N. Miroshnikova, V. F. Markov
Formato: article
Lenguaje:EN
RU
Publicado: Uralʹskij federalʹnyj universitet imeni pervogo Prezidenta Rossii B.N. Elʹcina 2020
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Acceso en línea:https://doaj.org/article/95bffad14122408b939f4b51d44715c8
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spelling oai:doaj.org-article:95bffad14122408b939f4b51d44715c82021-12-01T05:53:11ZAnnealing effect on temperature stability and mechanical stress at the “CdxPb1−xS film – substrate” interface2411-141410.15826/chimtech.2020.7.4.20https://doaj.org/article/95bffad14122408b939f4b51d44715c82020-12-01T00:00:00Zhttps://journals.urfu.ru/index.php/chimtech/article/view/4867https://doaj.org/toc/2411-1414The article establishes the upper temperature steadiness limit of СdxPb1-xS supersaturated solid solutions obtained by chemical bath deposition. СdxPb1-xS (x = 0.06; 0.122; 0.176) and (x = 0.02–0.05) films remained stable under the heating up to 405–410 and 450 K, respectively. SEM studies have shown that heating of СdxPb1-xS films (x = 0.02–0.05) to 620 K leads to the structure destruction. Internal mechanical compressive stresses at the "СdxPb1-xS film-substrate" interface was calculated in the range of 300–900 K for the first time ever, the highest values reached 2000–2750 kN/m2 for a number of the films compositions. In contrast to solid solutions, the expansion stresses up to 100 kN/m2 were derived for the CdS layer at 900 K. The obtained temperature steadiness boundaries and the mechanical stresses of СdxPb1-xS films must be taken into account in the development of photonic devices based on such materials.L. N. MaskaevaA. D. KutyavinaA. V. PozdinB. N. MiroshnikovI. N. MiroshnikovaV. F. MarkovUralʹskij federalʹnyj universitet imeni pervogo Prezidenta Rossii B.N. Elʹcina articlechemical bath deposition (cbd)thin filmscdxpb1−xs solid solutionsannealingmechanical stressChemistryQD1-999ENRUChimica Techno Acta, Vol 7, Iss 4, Pp 250-258 (2020)
institution DOAJ
collection DOAJ
language EN
RU
topic chemical bath deposition (cbd)
thin films
cdxpb1−xs solid solutions
annealing
mechanical stress
Chemistry
QD1-999
spellingShingle chemical bath deposition (cbd)
thin films
cdxpb1−xs solid solutions
annealing
mechanical stress
Chemistry
QD1-999
L. N. Maskaeva
A. D. Kutyavina
A. V. Pozdin
B. N. Miroshnikov
I. N. Miroshnikova
V. F. Markov
Annealing effect on temperature stability and mechanical stress at the “CdxPb1−xS film – substrate” interface
description The article establishes the upper temperature steadiness limit of СdxPb1-xS supersaturated solid solutions obtained by chemical bath deposition. СdxPb1-xS (x = 0.06; 0.122; 0.176) and (x = 0.02–0.05) films remained stable under the heating up to 405–410 and 450 K, respectively. SEM studies have shown that heating of СdxPb1-xS films (x = 0.02–0.05) to 620 K leads to the structure destruction. Internal mechanical compressive stresses at the "СdxPb1-xS film-substrate" interface was calculated in the range of 300–900 K for the first time ever, the highest values reached 2000–2750 kN/m2 for a number of the films compositions. In contrast to solid solutions, the expansion stresses up to 100 kN/m2 were derived for the CdS layer at 900 K. The obtained temperature steadiness boundaries and the mechanical stresses of СdxPb1-xS films must be taken into account in the development of photonic devices based on such materials.
format article
author L. N. Maskaeva
A. D. Kutyavina
A. V. Pozdin
B. N. Miroshnikov
I. N. Miroshnikova
V. F. Markov
author_facet L. N. Maskaeva
A. D. Kutyavina
A. V. Pozdin
B. N. Miroshnikov
I. N. Miroshnikova
V. F. Markov
author_sort L. N. Maskaeva
title Annealing effect on temperature stability and mechanical stress at the “CdxPb1−xS film – substrate” interface
title_short Annealing effect on temperature stability and mechanical stress at the “CdxPb1−xS film – substrate” interface
title_full Annealing effect on temperature stability and mechanical stress at the “CdxPb1−xS film – substrate” interface
title_fullStr Annealing effect on temperature stability and mechanical stress at the “CdxPb1−xS film – substrate” interface
title_full_unstemmed Annealing effect on temperature stability and mechanical stress at the “CdxPb1−xS film – substrate” interface
title_sort annealing effect on temperature stability and mechanical stress at the “cdxpb1−xs film – substrate” interface
publisher Uralʹskij federalʹnyj universitet imeni pervogo Prezidenta Rossii B.N. Elʹcina
publishDate 2020
url https://doaj.org/article/95bffad14122408b939f4b51d44715c8
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