Spontaneous current constriction in threshold switching devices

Today the phenomenon underlying threshold switching of Oxide-based resistive memories is an unresolved debate. Here, the authors report that the TaOx-based conductive filament formation, the current density and temperature are not-uniform distributions and electric field domains are not required.

Guardado en:
Detalles Bibliográficos
Autores principales: Jonathan M. Goodwill, Georg Ramer, Dasheng Li, Brian D. Hoskins, Georges Pavlidis, Jabez J. McClelland, Andrea Centrone, James A. Bain, Marek Skowronski
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2019
Materias:
Q
Acceso en línea:https://doaj.org/article/97f7a07a55ec43febc4d159255dbad9d
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
id oai:doaj.org-article:97f7a07a55ec43febc4d159255dbad9d
record_format dspace
spelling oai:doaj.org-article:97f7a07a55ec43febc4d159255dbad9d2021-12-02T15:36:07ZSpontaneous current constriction in threshold switching devices10.1038/s41467-019-09679-92041-1723https://doaj.org/article/97f7a07a55ec43febc4d159255dbad9d2019-04-01T00:00:00Zhttps://doi.org/10.1038/s41467-019-09679-9https://doaj.org/toc/2041-1723Today the phenomenon underlying threshold switching of Oxide-based resistive memories is an unresolved debate. Here, the authors report that the TaOx-based conductive filament formation, the current density and temperature are not-uniform distributions and electric field domains are not required.Jonathan M. GoodwillGeorg RamerDasheng LiBrian D. HoskinsGeorges PavlidisJabez J. McClellandAndrea CentroneJames A. BainMarek SkowronskiNature PortfolioarticleScienceQENNature Communications, Vol 10, Iss 1, Pp 1-8 (2019)
institution DOAJ
collection DOAJ
language EN
topic Science
Q
spellingShingle Science
Q
Jonathan M. Goodwill
Georg Ramer
Dasheng Li
Brian D. Hoskins
Georges Pavlidis
Jabez J. McClelland
Andrea Centrone
James A. Bain
Marek Skowronski
Spontaneous current constriction in threshold switching devices
description Today the phenomenon underlying threshold switching of Oxide-based resistive memories is an unresolved debate. Here, the authors report that the TaOx-based conductive filament formation, the current density and temperature are not-uniform distributions and electric field domains are not required.
format article
author Jonathan M. Goodwill
Georg Ramer
Dasheng Li
Brian D. Hoskins
Georges Pavlidis
Jabez J. McClelland
Andrea Centrone
James A. Bain
Marek Skowronski
author_facet Jonathan M. Goodwill
Georg Ramer
Dasheng Li
Brian D. Hoskins
Georges Pavlidis
Jabez J. McClelland
Andrea Centrone
James A. Bain
Marek Skowronski
author_sort Jonathan M. Goodwill
title Spontaneous current constriction in threshold switching devices
title_short Spontaneous current constriction in threshold switching devices
title_full Spontaneous current constriction in threshold switching devices
title_fullStr Spontaneous current constriction in threshold switching devices
title_full_unstemmed Spontaneous current constriction in threshold switching devices
title_sort spontaneous current constriction in threshold switching devices
publisher Nature Portfolio
publishDate 2019
url https://doaj.org/article/97f7a07a55ec43febc4d159255dbad9d
work_keys_str_mv AT jonathanmgoodwill spontaneouscurrentconstrictioninthresholdswitchingdevices
AT georgramer spontaneouscurrentconstrictioninthresholdswitchingdevices
AT dashengli spontaneouscurrentconstrictioninthresholdswitchingdevices
AT briandhoskins spontaneouscurrentconstrictioninthresholdswitchingdevices
AT georgespavlidis spontaneouscurrentconstrictioninthresholdswitchingdevices
AT jabezjmcclelland spontaneouscurrentconstrictioninthresholdswitchingdevices
AT andreacentrone spontaneouscurrentconstrictioninthresholdswitchingdevices
AT jamesabain spontaneouscurrentconstrictioninthresholdswitchingdevices
AT marekskowronski spontaneouscurrentconstrictioninthresholdswitchingdevices
_version_ 1718386369060929536