Use time series NDVI and EVI to develop dynamic crop growth metrics for yield modeling

The normalized difference vegetation index (NDVI) and enhanced vegetation index (EVI) derived from Moderate Resolution Imaging Spectroradiometer (MODIS) satellite imagery are widely used for crop yield analysis. However, the growth metrics derived from the MODIS NDVI or EVI have so far not been expl...

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Autores principales: Sadia Alam Shammi, Qingmin Meng
Formato: article
Lenguaje:EN
Publicado: Elsevier 2021
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Acceso en línea:https://doaj.org/article/98b1358d188e428fab46feb1a9280479
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