Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure

Scanning electron microscopy (SEM) has contributed to elucidating the ultrastructure of bio-specimens in three dimensions. SEM imagery detects several kinds of signals, of which secondary electrons (SEs) and backscattered electrons (BSEs) are the main electrons used in biological and biomedical rese...

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Autores principales: Daisuke Koga, Satoshi Kusumi, Masahiro Shibata, Tsuyoshi Watanabe
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Publicado: Frontiers Media S.A. 2021
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spelling oai:doaj.org-article:9b1861472feb4e70beb27ea3eae1cf222021-12-02T11:22:02ZApplications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure1662-512910.3389/fnana.2021.759804https://doaj.org/article/9b1861472feb4e70beb27ea3eae1cf222021-12-01T00:00:00Zhttps://www.frontiersin.org/articles/10.3389/fnana.2021.759804/fullhttps://doaj.org/toc/1662-5129Scanning electron microscopy (SEM) has contributed to elucidating the ultrastructure of bio-specimens in three dimensions. SEM imagery detects several kinds of signals, of which secondary electrons (SEs) and backscattered electrons (BSEs) are the main electrons used in biological and biomedical research. SE and BSE signals provide a three-dimensional (3D) surface topography and information on the composition of specimens, respectively. Among the various sample preparation techniques for SE-mode SEM, the osmium maceration method is the only approach for examining the subcellular structure that does not require any reconstruction processes. The 3D ultrastructure of organelles, such as the Golgi apparatus, mitochondria, and endoplasmic reticulum has been uncovered using high-resolution SEM of osmium-macerated tissues. Recent instrumental advances in scanning electron microscopes have broadened the applications of SEM for examining bio-specimens and enabled imaging of resin-embedded tissue blocks and sections using BSE-mode SEM under low-accelerating voltages; such techniques are fundamental to the 3D-SEM methods that are now known as focused ion-beam SEM, serial block-face SEM, and array tomography (i.e., serial section SEM). This technical breakthrough has allowed us to establish an innovative BSE imaging technique called section-face imaging to acquire ultrathin information from resin-embedded tissue sections. In contrast, serial section SEM is a modern 3D imaging technique for creating 3D surface rendering models of cells and organelles from tomographic BSE images of consecutive ultrathin sections embedded in resin. In this article, we introduce our related SEM techniques that use SE and BSE signals, such as the osmium maceration method, semithin section SEM (section-face imaging of resin-embedded semithin sections), section-face imaging for correlative light and SEM, and serial section SEM, to summarize their applications to neural structure and discuss the future possibilities and directions for these methods.Daisuke KogaSatoshi KusumiMasahiro ShibataTsuyoshi WatanabeFrontiers Media S.A.articleosmium maceration methodsection-face imagingsemithin section SEMCLEMCLSEMserial section SEMNeurosciences. Biological psychiatry. NeuropsychiatryRC321-571Human anatomyQM1-695ENFrontiers in Neuroanatomy, Vol 15 (2021)
institution DOAJ
collection DOAJ
language EN
topic osmium maceration method
section-face imaging
semithin section SEM
CLEM
CLSEM
serial section SEM
Neurosciences. Biological psychiatry. Neuropsychiatry
RC321-571
Human anatomy
QM1-695
spellingShingle osmium maceration method
section-face imaging
semithin section SEM
CLEM
CLSEM
serial section SEM
Neurosciences. Biological psychiatry. Neuropsychiatry
RC321-571
Human anatomy
QM1-695
Daisuke Koga
Satoshi Kusumi
Masahiro Shibata
Tsuyoshi Watanabe
Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure
description Scanning electron microscopy (SEM) has contributed to elucidating the ultrastructure of bio-specimens in three dimensions. SEM imagery detects several kinds of signals, of which secondary electrons (SEs) and backscattered electrons (BSEs) are the main electrons used in biological and biomedical research. SE and BSE signals provide a three-dimensional (3D) surface topography and information on the composition of specimens, respectively. Among the various sample preparation techniques for SE-mode SEM, the osmium maceration method is the only approach for examining the subcellular structure that does not require any reconstruction processes. The 3D ultrastructure of organelles, such as the Golgi apparatus, mitochondria, and endoplasmic reticulum has been uncovered using high-resolution SEM of osmium-macerated tissues. Recent instrumental advances in scanning electron microscopes have broadened the applications of SEM for examining bio-specimens and enabled imaging of resin-embedded tissue blocks and sections using BSE-mode SEM under low-accelerating voltages; such techniques are fundamental to the 3D-SEM methods that are now known as focused ion-beam SEM, serial block-face SEM, and array tomography (i.e., serial section SEM). This technical breakthrough has allowed us to establish an innovative BSE imaging technique called section-face imaging to acquire ultrathin information from resin-embedded tissue sections. In contrast, serial section SEM is a modern 3D imaging technique for creating 3D surface rendering models of cells and organelles from tomographic BSE images of consecutive ultrathin sections embedded in resin. In this article, we introduce our related SEM techniques that use SE and BSE signals, such as the osmium maceration method, semithin section SEM (section-face imaging of resin-embedded semithin sections), section-face imaging for correlative light and SEM, and serial section SEM, to summarize their applications to neural structure and discuss the future possibilities and directions for these methods.
format article
author Daisuke Koga
Satoshi Kusumi
Masahiro Shibata
Tsuyoshi Watanabe
author_facet Daisuke Koga
Satoshi Kusumi
Masahiro Shibata
Tsuyoshi Watanabe
author_sort Daisuke Koga
title Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure
title_short Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure
title_full Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure
title_fullStr Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure
title_full_unstemmed Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure
title_sort applications of scanning electron microscopy using secondary and backscattered electron signals in neural structure
publisher Frontiers Media S.A.
publishDate 2021
url https://doaj.org/article/9b1861472feb4e70beb27ea3eae1cf22
work_keys_str_mv AT daisukekoga applicationsofscanningelectronmicroscopyusingsecondaryandbackscatteredelectronsignalsinneuralstructure
AT satoshikusumi applicationsofscanningelectronmicroscopyusingsecondaryandbackscatteredelectronsignalsinneuralstructure
AT masahiroshibata applicationsofscanningelectronmicroscopyusingsecondaryandbackscatteredelectronsignalsinneuralstructure
AT tsuyoshiwatanabe applicationsofscanningelectronmicroscopyusingsecondaryandbackscatteredelectronsignalsinneuralstructure
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