Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry

Scanning transmission electron microscopy is a powerful material probe, but constrained to large atomic number samples due to the issues of beam damage and weak scattering. Here, Ophus et al.propose a method that produces linear phase contrast in a focused electron beam to image dose-sensitive objec...

Descripción completa

Guardado en:

Detalles Bibliográficos
Autores principales:	Colin Ophus, Jim Ciston, Jordan Pierce, Tyler R. Harvey, Jordan Chess, Benjamin J. McMorran, Cory Czarnik, Harald H. Rose, Peter Ercius
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2016
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/9d85723497ef455f8d98cda4fc18fa77
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

id	oai:doaj.org-article:9d85723497ef455f8d98cda4fc18fa77
record_format	dspace
spelling	oai:doaj.org-article:9d85723497ef455f8d98cda4fc18fa772021-12-02T14:40:11ZEfficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry10.1038/ncomms107192041-1723https://doaj.org/article/9d85723497ef455f8d98cda4fc18fa772016-02-01T00:00:00Zhttps://doi.org/10.1038/ncomms10719https://doaj.org/toc/2041-1723Scanning transmission electron microscopy is a powerful material probe, but constrained to large atomic number samples due to the issues of beam damage and weak scattering. Here, Ophus et al.propose a method that produces linear phase contrast in a focused electron beam to image dose-sensitive objects.Colin OphusJim CistonJordan PierceTyler R. HarveyJordan ChessBenjamin J. McMorranCory CzarnikHarald H. RosePeter ErciusNature PortfolioarticleScienceQENNature Communications, Vol 7, Iss 1, Pp 1-7 (2016)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Colin Ophus Jim Ciston Jordan Pierce Tyler R. Harvey Jordan Chess Benjamin J. McMorran Cory Czarnik Harald H. Rose Peter Ercius Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
description	Scanning transmission electron microscopy is a powerful material probe, but constrained to large atomic number samples due to the issues of beam damage and weak scattering. Here, Ophus et al.propose a method that produces linear phase contrast in a focused electron beam to image dose-sensitive objects.
format	article
author	Colin Ophus Jim Ciston Jordan Pierce Tyler R. Harvey Jordan Chess Benjamin J. McMorran Cory Czarnik Harald H. Rose Peter Ercius
author_facet	Colin Ophus Jim Ciston Jordan Pierce Tyler R. Harvey Jordan Chess Benjamin J. McMorran Cory Czarnik Harald H. Rose Peter Ercius
author_sort	Colin Ophus
title	Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
title_short	Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
title_full	Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
title_fullStr	Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
title_full_unstemmed	Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
title_sort	efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
publisher	Nature Portfolio
publishDate	2016
url	https://doaj.org/article/9d85723497ef455f8d98cda4fc18fa77
work_keys_str_mv	AT colinophus efficientlinearphasecontrastinscanningtransmissionelectronmicroscopywithmatchedilluminationanddetectorinterferometry AT jimciston efficientlinearphasecontrastinscanningtransmissionelectronmicroscopywithmatchedilluminationanddetectorinterferometry AT jordanpierce efficientlinearphasecontrastinscanningtransmissionelectronmicroscopywithmatchedilluminationanddetectorinterferometry AT tylerrharvey efficientlinearphasecontrastinscanningtransmissionelectronmicroscopywithmatchedilluminationanddetectorinterferometry AT jordanchess efficientlinearphasecontrastinscanningtransmissionelectronmicroscopywithmatchedilluminationanddetectorinterferometry AT benjaminjmcmorran efficientlinearphasecontrastinscanningtransmissionelectronmicroscopywithmatchedilluminationanddetectorinterferometry AT coryczarnik efficientlinearphasecontrastinscanningtransmissionelectronmicroscopywithmatchedilluminationanddetectorinterferometry AT haraldhrose efficientlinearphasecontrastinscanningtransmissionelectronmicroscopywithmatchedilluminationanddetectorinterferometry AT peterercius efficientlinearphasecontrastinscanningtransmissionelectronmicroscopywithmatchedilluminationanddetectorinterferometry
_version_	1718390372167581696

Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry

Ejemplares similares