Fabrication and characterization of high-performance photodetectors based on Au/CdS/Au and Au/Ni:CdS/Au junctions

The synthesis, characterization, and photodetector application of pure and Ni doped CdS thin films prepared by the spray pyrolysis technique are presented in this paper. Various techniques were used to analyze the thin films that had been produced. The hexagonal phase of the produced thin films is c...

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Autores principales: Hasan Albargi, Z.R. Khan, R. Marnadu, H.Y. Ammar, Hassan Algadi, Ahmad Umar, I.M. Ashraf, Mohd. Shkir
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Publicado: Elsevier 2021
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spelling oai:doaj.org-article:9eab13957a8e4ccbb79fd52e4a7c7ec02021-11-18T04:44:16ZFabrication and characterization of high-performance photodetectors based on Au/CdS/Au and Au/Ni:CdS/Au junctions1018-364710.1016/j.jksus.2021.101638https://doaj.org/article/9eab13957a8e4ccbb79fd52e4a7c7ec02021-12-01T00:00:00Zhttp://www.sciencedirect.com/science/article/pii/S1018364721003001https://doaj.org/toc/1018-3647The synthesis, characterization, and photodetector application of pure and Ni doped CdS thin films prepared by the spray pyrolysis technique are presented in this paper. Various techniques were used to analyze the thin films that had been produced. The hexagonal phase of the produced thin films is confirmed by X-ray diffraction (XRD) and FT-Raman (FTR) measurements. Scanning electron microscopy (SEM) was used to investigate the morphology of the thin film surface, revealing the development of nanograins. The energy band gaps for all of the prepared thin films were calculated to be approximately 2.4 eV. When the films were stimulated at 450 nm wavelength, a strong photoluminescence emission was seen at ∼540 ± 6 nm. The dark/photo I-V electrical performance of the developed films was observed. The fabricated Au/CdS/Au and Au/Ni:CdS/Au photodetectors were studied for recombination behavior, dark and photo surface resistivity, and photosensitivity. Interestingly, the dark surface resistivity was found to be greater compared to the photo-resistivity. When the light intensity was increased to 1450 Lux, the photosensitivity improves from 10% to 35%. These findings indicate that the fabricated CdS/Ni:CdS films-based photodetectors are suitable for optoelectronic devices.Hasan AlbargiZ.R. KhanR. MarnaduH.Y. AmmarHassan AlgadiAhmad UmarI.M. AshrafMohd. ShkirElsevierarticleNi:CdS thin filmsStructural propertiesOptical propertiesNonlinear opticsAu CdS AuAu Ni:CdSScience (General)Q1-390ENJournal of King Saud University: Science, Vol 33, Iss 8, Pp 101638- (2021)
institution DOAJ
collection DOAJ
language EN
topic Ni:CdS thin films
Structural properties
Optical properties
Nonlinear optics
Au CdS Au
Au Ni:CdS
Science (General)
Q1-390
spellingShingle Ni:CdS thin films
Structural properties
Optical properties
Nonlinear optics
Au CdS Au
Au Ni:CdS
Science (General)
Q1-390
Hasan Albargi
Z.R. Khan
R. Marnadu
H.Y. Ammar
Hassan Algadi
Ahmad Umar
I.M. Ashraf
Mohd. Shkir
Fabrication and characterization of high-performance photodetectors based on Au/CdS/Au and Au/Ni:CdS/Au junctions
description The synthesis, characterization, and photodetector application of pure and Ni doped CdS thin films prepared by the spray pyrolysis technique are presented in this paper. Various techniques were used to analyze the thin films that had been produced. The hexagonal phase of the produced thin films is confirmed by X-ray diffraction (XRD) and FT-Raman (FTR) measurements. Scanning electron microscopy (SEM) was used to investigate the morphology of the thin film surface, revealing the development of nanograins. The energy band gaps for all of the prepared thin films were calculated to be approximately 2.4 eV. When the films were stimulated at 450 nm wavelength, a strong photoluminescence emission was seen at ∼540 ± 6 nm. The dark/photo I-V electrical performance of the developed films was observed. The fabricated Au/CdS/Au and Au/Ni:CdS/Au photodetectors were studied for recombination behavior, dark and photo surface resistivity, and photosensitivity. Interestingly, the dark surface resistivity was found to be greater compared to the photo-resistivity. When the light intensity was increased to 1450 Lux, the photosensitivity improves from 10% to 35%. These findings indicate that the fabricated CdS/Ni:CdS films-based photodetectors are suitable for optoelectronic devices.
format article
author Hasan Albargi
Z.R. Khan
R. Marnadu
H.Y. Ammar
Hassan Algadi
Ahmad Umar
I.M. Ashraf
Mohd. Shkir
author_facet Hasan Albargi
Z.R. Khan
R. Marnadu
H.Y. Ammar
Hassan Algadi
Ahmad Umar
I.M. Ashraf
Mohd. Shkir
author_sort Hasan Albargi
title Fabrication and characterization of high-performance photodetectors based on Au/CdS/Au and Au/Ni:CdS/Au junctions
title_short Fabrication and characterization of high-performance photodetectors based on Au/CdS/Au and Au/Ni:CdS/Au junctions
title_full Fabrication and characterization of high-performance photodetectors based on Au/CdS/Au and Au/Ni:CdS/Au junctions
title_fullStr Fabrication and characterization of high-performance photodetectors based on Au/CdS/Au and Au/Ni:CdS/Au junctions
title_full_unstemmed Fabrication and characterization of high-performance photodetectors based on Au/CdS/Au and Au/Ni:CdS/Au junctions
title_sort fabrication and characterization of high-performance photodetectors based on au/cds/au and au/ni:cds/au junctions
publisher Elsevier
publishDate 2021
url https://doaj.org/article/9eab13957a8e4ccbb79fd52e4a7c7ec0
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