APA (7th ed.) Citation

Chang, S., Chang, P., Lin, W., Lo, S., Chang, L., Lee, S., & Tseng, Y. (2017). Voltage-induced Interface Reconstruction and Electrical Instability of the Ferromagnet-Semiconductor Device. Nature Portfolio.

Chicago Style (17th ed.) Citation

Chang, Shu-Jui, Po-Chun Chang, Wen-Chin Lin, Shao-Hua Lo, Liang-Chun Chang, Shang-Fan Lee, and Yuan-Chieh Tseng. Voltage-induced Interface Reconstruction and Electrical Instability of the Ferromagnet-Semiconductor Device. Nature Portfolio, 2017.

MLA (8th ed.) Citation

Chang, Shu-Jui, et al. Voltage-induced Interface Reconstruction and Electrical Instability of the Ferromagnet-Semiconductor Device. Nature Portfolio, 2017.