Scattering-type scanning near-field optical microscopy with low-repetition-rate pulsed light source through phase-domain sampling
Low repetition rate lasers are suitable for studying nonlinear optical phenomena, while near-field microscopy allows high spatial resolution for nanomaterial characterisation. Here, Wang et al. enable scattering-type near-field microscopy with low repetition rate lasers through phase-domain sampling...
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| Autores principales: | , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2016
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/a2710403210946d283653630b189c761 |
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| Sumario: | Low repetition rate lasers are suitable for studying nonlinear optical phenomena, while near-field microscopy allows high spatial resolution for nanomaterial characterisation. Here, Wang et al. enable scattering-type near-field microscopy with low repetition rate lasers through phase-domain sampling. |
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