Cita APA (7a ed.)

Acal, C., Ruiz-Castro, J. E., Maldonado, D., & Roldán, J. B. (2021). One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories. MDPI AG.

Cita Chicago Style (17a ed.)

Acal, Christian, Juan E. Ruiz-Castro, David Maldonado, y Juan B. Roldán. One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories. MDPI AG, 2021.

Cita MLA (8a ed.)

Acal, Christian, et al. One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories. MDPI AG, 2021.