Acal, C., Ruiz-Castro, J. E., Maldonado, D., & Roldán, J. B. (2021). One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories. MDPI AG.
Style de citation Chicago (17e éd.)Acal, Christian, Juan E. Ruiz-Castro, David Maldonado, et Juan B. Roldán. One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories. MDPI AG, 2021.
Style de citation MLA (8e éd.)Acal, Christian, et al. One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories. MDPI AG, 2021.
Attention : ces citations peuvent ne pas être correctes à 100%.