One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories

A new probability distribution to study lifetime data in reliability is introduced in this paper. This one is a first approach to a non-homogeneous phase-type distribution. It is built by considering one cut-point in the non-negative semi-line of a phase-type distribution. The density function is de...

Descripción completa

Guardado en:

Detalles Bibliográficos
Autores principales:	Christian Acal, Juan E. Ruiz-Castro, David Maldonado, Juan B. Roldán
Formato:	article
Lenguaje:	EN
Publicado:	MDPI AG 2021
Materias:	one cut-point phase-type distribution maximum likelihood estimation RRAM variability Mathematics QA1-939
Acceso en línea:	https://doaj.org/article/a2ed05cff89d4fb18b1f15fea8c0a949
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

id	oai:doaj.org-article:a2ed05cff89d4fb18b1f15fea8c0a949
record_format	dspace
spelling	oai:doaj.org-article:a2ed05cff89d4fb18b1f15fea8c0a9492021-11-11T18:17:05ZOne Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories10.3390/math92127342227-7390https://doaj.org/article/a2ed05cff89d4fb18b1f15fea8c0a9492021-10-01T00:00:00Zhttps://www.mdpi.com/2227-7390/9/21/2734https://doaj.org/toc/2227-7390A new probability distribution to study lifetime data in reliability is introduced in this paper. This one is a first approach to a non-homogeneous phase-type distribution. It is built by considering one cut-point in the non-negative semi-line of a phase-type distribution. The density function is defined and the main measures associated, such as the reliability function, hazard rate, cumulative hazard rate and the characteristic function, are also worked out. This new class of distributions enables us to decrease the number of parameters in the estimate when inference is considered. Additionally, the likelihood distribution is built to estimate the model parameters by maximum likelihood. Several applications considering Resistive Random Access Memories compare the adjustment when phase type distributions and one cut-point phase-type distributions are considered. The developed methodology has been computationally implemented in R-cran.Christian AcalJuan E. Ruiz-CastroDavid MaldonadoJuan B. RoldánMDPI AGarticleone cut-point phase-type distributionmaximum likelihoodestimationRRAMvariabilityMathematicsQA1-939ENMathematics, Vol 9, Iss 2734, p 2734 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	one cut-point phase-type distribution maximum likelihood estimation RRAM variability Mathematics QA1-939
spellingShingle	one cut-point phase-type distribution maximum likelihood estimation RRAM variability Mathematics QA1-939 Christian Acal Juan E. Ruiz-Castro David Maldonado Juan B. Roldán One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories
description	A new probability distribution to study lifetime data in reliability is introduced in this paper. This one is a first approach to a non-homogeneous phase-type distribution. It is built by considering one cut-point in the non-negative semi-line of a phase-type distribution. The density function is defined and the main measures associated, such as the reliability function, hazard rate, cumulative hazard rate and the characteristic function, are also worked out. This new class of distributions enables us to decrease the number of parameters in the estimate when inference is considered. Additionally, the likelihood distribution is built to estimate the model parameters by maximum likelihood. Several applications considering Resistive Random Access Memories compare the adjustment when phase type distributions and one cut-point phase-type distributions are considered. The developed methodology has been computationally implemented in R-cran.
format	article
author	Christian Acal Juan E. Ruiz-Castro David Maldonado Juan B. Roldán
author_facet	Christian Acal Juan E. Ruiz-Castro David Maldonado Juan B. Roldán
author_sort	Christian Acal
title	One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories
title_short	One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories
title_full	One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories
title_fullStr	One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories
title_full_unstemmed	One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories
title_sort	one cut-point phase-type distributions in reliability. an application to resistive random access memories
publisher	MDPI AG
publishDate	2021
url	https://doaj.org/article/a2ed05cff89d4fb18b1f15fea8c0a949
work_keys_str_mv	AT christianacal onecutpointphasetypedistributionsinreliabilityanapplicationtoresistiverandomaccessmemories AT juaneruizcastro onecutpointphasetypedistributionsinreliabilityanapplicationtoresistiverandomaccessmemories AT davidmaldonado onecutpointphasetypedistributionsinreliabilityanapplicationtoresistiverandomaccessmemories AT juanbroldan onecutpointphasetypedistributionsinreliabilityanapplicationtoresistiverandomaccessmemories
_version_	1718431902291984384

One Cut-Point Phase-Type Distributions in Reliability. An Application to Resistive Random Access Memories

Ejemplares similares