Optical In-Process Measurement: Concepts for Precise, Fast and Robust Optical Metrology for Complex Measurement Situations

Optical metrology is a key element for many areas of modern production. Preferably, measurements should take place within the production line (in-process) and keep pace with production speed, even if the parts have a complex geometry or are difficult to access. The challenge for modern optical in-pr...

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Autores principales:	Ralf B. Bergmann, Michael Kalms, Claas Falldorf
Formato:	article
Lenguaje:	EN
Publicado:	MDPI AG 2021
Materias:	in-process measurement in situ measurement optical metrology quality control interferometry fringe projection Technology T Engineering (General). Civil engineering (General) TA1-2040 Biology (General) QH301-705.5 Physics QC1-999 Chemistry QD1-999
Acceso en línea:	https://doaj.org/article/a34c22c9ddcc479a8fd8868f05e108ac
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spelling	oai:doaj.org-article:a34c22c9ddcc479a8fd8868f05e108ac2021-11-25T16:30:56ZOptical In-Process Measurement: Concepts for Precise, Fast and Robust Optical Metrology for Complex Measurement Situations10.3390/app1122105332076-3417https://doaj.org/article/a34c22c9ddcc479a8fd8868f05e108ac2021-11-01T00:00:00Zhttps://www.mdpi.com/2076-3417/11/22/10533https://doaj.org/toc/2076-3417Optical metrology is a key element for many areas of modern production. Preferably, measurements should take place within the production line (in-process) and keep pace with production speed, even if the parts have a complex geometry or are difficult to access. The challenge for modern optical in-process measurements is, therefore, how to simultaneously make optical metrology precise, fast, robust and capable of handling geometrical complexity. The potential of individual techniques to achieve these demands can be visualized by the tetrahedron of optical metrology. Depending on the application, techniques based on interferometry or geometrical optics may have to be preferred. The paper emphasizes complexity and robustness as prime areas of improvement. Concerning interferometric techniques, we report on fast acquisition as used in holography, tailoring of coherence properties and use of Multiple simultaneous Viewing direction holography (MultiView), self reference used in Computational Shear Interferometry (CoSI) and the simultaneous use of several light sources in Multiple Aperture Shear Interferometry (MArS) based on CoSI as these techniques have proven to be particularly effective. The use of advanced approaches based on CoSI requires a transition of the description of light from the use of the well-known wave field to the coherence function of light. Techniques based on geometric optics are generally comparatively robust against environmental disturbances, and Fringe Projection (FP) is shown to be especially useful in very demanding measurement conditions.Ralf B. BergmannMichael KalmsClaas FalldorfMDPI AGarticlein-process measurementin situ measurementoptical metrologyquality controlinterferometryfringe projectionTechnologyTEngineering (General). Civil engineering (General)TA1-2040Biology (General)QH301-705.5PhysicsQC1-999ChemistryQD1-999ENApplied Sciences, Vol 11, Iss 10533, p 10533 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	in-process measurement in situ measurement optical metrology quality control interferometry fringe projection Technology T Engineering (General). Civil engineering (General) TA1-2040 Biology (General) QH301-705.5 Physics QC1-999 Chemistry QD1-999
spellingShingle	in-process measurement in situ measurement optical metrology quality control interferometry fringe projection Technology T Engineering (General). Civil engineering (General) TA1-2040 Biology (General) QH301-705.5 Physics QC1-999 Chemistry QD1-999 Ralf B. Bergmann Michael Kalms Claas Falldorf Optical In-Process Measurement: Concepts for Precise, Fast and Robust Optical Metrology for Complex Measurement Situations
description	Optical metrology is a key element for many areas of modern production. Preferably, measurements should take place within the production line (in-process) and keep pace with production speed, even if the parts have a complex geometry or are difficult to access. The challenge for modern optical in-process measurements is, therefore, how to simultaneously make optical metrology precise, fast, robust and capable of handling geometrical complexity. The potential of individual techniques to achieve these demands can be visualized by the tetrahedron of optical metrology. Depending on the application, techniques based on interferometry or geometrical optics may have to be preferred. The paper emphasizes complexity and robustness as prime areas of improvement. Concerning interferometric techniques, we report on fast acquisition as used in holography, tailoring of coherence properties and use of Multiple simultaneous Viewing direction holography (MultiView), self reference used in Computational Shear Interferometry (CoSI) and the simultaneous use of several light sources in Multiple Aperture Shear Interferometry (MArS) based on CoSI as these techniques have proven to be particularly effective. The use of advanced approaches based on CoSI requires a transition of the description of light from the use of the well-known wave field to the coherence function of light. Techniques based on geometric optics are generally comparatively robust against environmental disturbances, and Fringe Projection (FP) is shown to be especially useful in very demanding measurement conditions.
format	article
author	Ralf B. Bergmann Michael Kalms Claas Falldorf
author_facet	Ralf B. Bergmann Michael Kalms Claas Falldorf
author_sort	Ralf B. Bergmann
title	Optical In-Process Measurement: Concepts for Precise, Fast and Robust Optical Metrology for Complex Measurement Situations
title_short	Optical In-Process Measurement: Concepts for Precise, Fast and Robust Optical Metrology for Complex Measurement Situations
title_full	Optical In-Process Measurement: Concepts for Precise, Fast and Robust Optical Metrology for Complex Measurement Situations
title_fullStr	Optical In-Process Measurement: Concepts for Precise, Fast and Robust Optical Metrology for Complex Measurement Situations
title_full_unstemmed	Optical In-Process Measurement: Concepts for Precise, Fast and Robust Optical Metrology for Complex Measurement Situations
title_sort	optical in-process measurement: concepts for precise, fast and robust optical metrology for complex measurement situations
publisher	MDPI AG
publishDate	2021
url	https://doaj.org/article/a34c22c9ddcc479a8fd8868f05e108ac
work_keys_str_mv	AT ralfbbergmann opticalinprocessmeasurementconceptsforprecisefastandrobustopticalmetrologyforcomplexmeasurementsituations AT michaelkalms opticalinprocessmeasurementconceptsforprecisefastandrobustopticalmetrologyforcomplexmeasurementsituations AT claasfalldorf opticalinprocessmeasurementconceptsforprecisefastandrobustopticalmetrologyforcomplexmeasurementsituations
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Optical In-Process Measurement: Concepts for Precise, Fast and Robust Optical Metrology for Complex Measurement Situations

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