Removal of back-reflection noise at ultrathin imaging probes by the single-core illumination and wide-field detection
Abstract Thin waveguides such as graded-index lenses and fiber bundles are often used as imaging probes for high-resolution endomicroscopes. However, strong back-reflection from the end surfaces of the probes makes it difficult for them to resolve weak contrast objects, especially in the reflectance...
Guardado en:
Autores principales: | Changhyeong Yoon, Munkyu Kang, Jin H. Hong, Taeseok D. Yang, Jingchao Xing, Hongki Yoo, Youngwoon Choi, Wonshik Choi |
---|---|
Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2017
|
Materias: | |
Acceso en línea: | https://doaj.org/article/a409a91b80e74e01870f26cdfb37b5b9 |
Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
Ejemplares similares
-
The effect of pupil transmittance on axial resolution of reflection phase microscopy
por: Min Gyu Hyeon, et al.
Publicado: (2021) -
Efficient and Accurate Synapse Detection With Selective Structured Illumination Microscopy on the Putative Regions of Interest of Ultrathin Serial Sections
por: Gyeong Tae Kim, et al.
Publicado: (2021) -
Microsphere-based interferometric optical probe
por: Yongjae Jo, et al.
Publicado: (2018) -
Noise rejection through an improved quantum illumination protocol
por: T. Gregory, et al.
Publicado: (2021) -
Tunneling time probed by quantum shot noise
por: Pierre Février, et al.
Publicado: (2018)