Virtual substrate method for nanomaterials characterization
Quantitative characterization of supported nanomaterials is challenging, because the nanomaterial signals cannot easily be deconvoluted from those of the substrate. Here, the authors introduce an inventive approach to overcome this problem for electron-based surface analysis techniques.
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| Autores principales: | , , , , , , , , , , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2017
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/a4b91c49af054e57bb2dcd903a590157 |
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