Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy

The fs control of an insulator-to-metal transition down to a few nanometers and its real-time/real space observation remain a challenge. Here, the authors demonstrate a method based on ultrafast electron microscopy to provide a nm/fs resolved view of the electronic dynamics in a single VO2 nanowire.

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Autores principales:	Xuewen Fu, Francesco Barantani, Simone Gargiulo, Ivan Madan, Gabriele Berruto, Thomas LaGrange, Lei Jin, Junqiao Wu, Giovanni Maria Vanacore, Fabrizio Carbone, Yimei Zhu
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2020
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/a5288e0f0b3c4113bfbd60403b624d6a
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spelling	oai:doaj.org-article:a5288e0f0b3c4113bfbd60403b624d6a2021-12-02T15:39:24ZNanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy10.1038/s41467-020-19636-62041-1723https://doaj.org/article/a5288e0f0b3c4113bfbd60403b624d6a2020-11-01T00:00:00Zhttps://doi.org/10.1038/s41467-020-19636-6https://doaj.org/toc/2041-1723The fs control of an insulator-to-metal transition down to a few nanometers and its real-time/real space observation remain a challenge. Here, the authors demonstrate a method based on ultrafast electron microscopy to provide a nm/fs resolved view of the electronic dynamics in a single VO2 nanowire.Xuewen FuFrancesco BarantaniSimone GargiuloIvan MadanGabriele BerrutoThomas LaGrangeLei JinJunqiao WuGiovanni Maria VanacoreFabrizio CarboneYimei ZhuNature PortfolioarticleScienceQENNature Communications, Vol 11, Iss 1, Pp 1-11 (2020)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Xuewen Fu Francesco Barantani Simone Gargiulo Ivan Madan Gabriele Berruto Thomas LaGrange Lei Jin Junqiao Wu Giovanni Maria Vanacore Fabrizio Carbone Yimei Zhu Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy
description	The fs control of an insulator-to-metal transition down to a few nanometers and its real-time/real space observation remain a challenge. Here, the authors demonstrate a method based on ultrafast electron microscopy to provide a nm/fs resolved view of the electronic dynamics in a single VO2 nanowire.
format	article
author	Xuewen Fu Francesco Barantani Simone Gargiulo Ivan Madan Gabriele Berruto Thomas LaGrange Lei Jin Junqiao Wu Giovanni Maria Vanacore Fabrizio Carbone Yimei Zhu
author_facet	Xuewen Fu Francesco Barantani Simone Gargiulo Ivan Madan Gabriele Berruto Thomas LaGrange Lei Jin Junqiao Wu Giovanni Maria Vanacore Fabrizio Carbone Yimei Zhu
author_sort	Xuewen Fu
title	Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy
title_short	Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy
title_full	Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy
title_fullStr	Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy
title_full_unstemmed	Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy
title_sort	nanoscale-femtosecond dielectric response of mott insulators captured by two-color near-field ultrafast electron microscopy
publisher	Nature Portfolio
publishDate	2020
url	https://doaj.org/article/a5288e0f0b3c4113bfbd60403b624d6a
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Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy

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