Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy
The fs control of an insulator-to-metal transition down to a few nanometers and its real-time/real space observation remain a challenge. Here, the authors demonstrate a method based on ultrafast electron microscopy to provide a nm/fs resolved view of the electronic dynamics in a single VO2 nanowire.
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Autores principales: | Xuewen Fu, Francesco Barantani, Simone Gargiulo, Ivan Madan, Gabriele Berruto, Thomas LaGrange, Lei Jin, Junqiao Wu, Giovanni Maria Vanacore, Fabrizio Carbone, Yimei Zhu |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2020
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Materias: | |
Acceso en línea: | https://doaj.org/article/a5288e0f0b3c4113bfbd60403b624d6a |
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