Rear side dielectrics on interdigitating p+-(i)-n+ back-contact solar cells − hydrogenation vs. charge effects

Polysilicon-on-oxide (POLO) passivating contacts and interdigitated back-contact (IBC) cell technologies have recently attracted a lot of interest as candidates for the implementation in the next generation of solar cells. An IBC cell with POLO junctions for both polarities − a POLO2-IBC cell − has...

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Autores principales: Rienäcker Michael, Larionova Yevgeniya, Krügener Jan, Wolter Sascha, Brendel Rolf, Peibst Robby
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Lenguaje:EN
Publicado: EDP Sciences 2021
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Acceso en línea:https://doaj.org/article/a53a4abacfde4d1e8f3260d122cab35d
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spelling oai:doaj.org-article:a53a4abacfde4d1e8f3260d122cab35d2021-11-12T11:44:56ZRear side dielectrics on interdigitating p+-(i)-n+ back-contact solar cells − hydrogenation vs. charge effects2105-071610.1051/epjpv/2021007https://doaj.org/article/a53a4abacfde4d1e8f3260d122cab35d2021-01-01T00:00:00Zhttps://www.epj-pv.org/articles/epjpv/full_html/2021/01/pv210040/pv210040.htmlhttps://doaj.org/toc/2105-0716Polysilicon-on-oxide (POLO) passivating contacts and interdigitated back-contact (IBC) cell technologies have recently attracted a lot of interest as candidates for the implementation in the next generation of solar cells. An IBC cell with POLO junctions for both polarities − a POLO2-IBC cell − has to electrically isolate the highly defective p+ and n+ poly-Si regions on the rear side of the cell to avoid parasitic recombination. Inserting an initially undoped, intrinsic (i) region between the p+ and n+ poly-Si regions was demonstrated to successfully prevent the parasitic recombination in the transition region of ISFH's 26.1%-efficient POLO2-IBC cell. In order to further improve the conversion efficiency towards 27%, we apply hydrogen-donating dielectric layer stacks to the p+-(i)-n+ POLO interdigitating rear side to enhance the passivation quality of the POLO junctions. We indeed show a significant improvement of POLO junctions on symmetrical full-area homogenously doped reference samples, but when we apply a hydrogen-donating layer stack on the p+-(i)-n+ POLO interdigitating rear side, we observe a strong degradation in the performance of the POLO2-IBC cell. We attribute this to the formation of a conductive channel between the p+ and n+ poly-Si regions due to the strong negative charge density of the hydrogen-donating layer stack.Rienäcker MichaelLarionova YevgeniyaKrügener JanWolter SaschaBrendel RolfPeibst RobbyEDP Sciencesarticlepoloibchydrogenationchargerecombinationpassivating contactpolysiliconRenewable energy sourcesTJ807-830ENEPJ Photovoltaics, Vol 12, p 6 (2021)
institution DOAJ
collection DOAJ
language EN
topic polo
ibc
hydrogenation
charge
recombination
passivating contact
polysilicon
Renewable energy sources
TJ807-830
spellingShingle polo
ibc
hydrogenation
charge
recombination
passivating contact
polysilicon
Renewable energy sources
TJ807-830
Rienäcker Michael
Larionova Yevgeniya
Krügener Jan
Wolter Sascha
Brendel Rolf
Peibst Robby
Rear side dielectrics on interdigitating p+-(i)-n+ back-contact solar cells − hydrogenation vs. charge effects
description Polysilicon-on-oxide (POLO) passivating contacts and interdigitated back-contact (IBC) cell technologies have recently attracted a lot of interest as candidates for the implementation in the next generation of solar cells. An IBC cell with POLO junctions for both polarities − a POLO2-IBC cell − has to electrically isolate the highly defective p+ and n+ poly-Si regions on the rear side of the cell to avoid parasitic recombination. Inserting an initially undoped, intrinsic (i) region between the p+ and n+ poly-Si regions was demonstrated to successfully prevent the parasitic recombination in the transition region of ISFH's 26.1%-efficient POLO2-IBC cell. In order to further improve the conversion efficiency towards 27%, we apply hydrogen-donating dielectric layer stacks to the p+-(i)-n+ POLO interdigitating rear side to enhance the passivation quality of the POLO junctions. We indeed show a significant improvement of POLO junctions on symmetrical full-area homogenously doped reference samples, but when we apply a hydrogen-donating layer stack on the p+-(i)-n+ POLO interdigitating rear side, we observe a strong degradation in the performance of the POLO2-IBC cell. We attribute this to the formation of a conductive channel between the p+ and n+ poly-Si regions due to the strong negative charge density of the hydrogen-donating layer stack.
format article
author Rienäcker Michael
Larionova Yevgeniya
Krügener Jan
Wolter Sascha
Brendel Rolf
Peibst Robby
author_facet Rienäcker Michael
Larionova Yevgeniya
Krügener Jan
Wolter Sascha
Brendel Rolf
Peibst Robby
author_sort Rienäcker Michael
title Rear side dielectrics on interdigitating p+-(i)-n+ back-contact solar cells − hydrogenation vs. charge effects
title_short Rear side dielectrics on interdigitating p+-(i)-n+ back-contact solar cells − hydrogenation vs. charge effects
title_full Rear side dielectrics on interdigitating p+-(i)-n+ back-contact solar cells − hydrogenation vs. charge effects
title_fullStr Rear side dielectrics on interdigitating p+-(i)-n+ back-contact solar cells − hydrogenation vs. charge effects
title_full_unstemmed Rear side dielectrics on interdigitating p+-(i)-n+ back-contact solar cells − hydrogenation vs. charge effects
title_sort rear side dielectrics on interdigitating p+-(i)-n+ back-contact solar cells − hydrogenation vs. charge effects
publisher EDP Sciences
publishDate 2021
url https://doaj.org/article/a53a4abacfde4d1e8f3260d122cab35d
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AT larionovayevgeniya rearsidedielectricsoninterdigitatingpinbackcontactsolarcellshydrogenationvschargeeffects
AT krugenerjan rearsidedielectricsoninterdigitatingpinbackcontactsolarcellshydrogenationvschargeeffects
AT woltersascha rearsidedielectricsoninterdigitatingpinbackcontactsolarcellshydrogenationvschargeeffects
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