A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement

Abstract This paper develops an active magnetic near field probe (H‐field probe) by using a four‐layer printed circuit board (PCB) technique. Two‐turn detection structure and a low noise amplifier are used to improve probe's frequency response. The two‐turn detection structure can maximize the...

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Autores principales:	Weiheng Shao, Jianke Li, Quan Huang, E Shao, Jiesheng Liu, Xiao He, Zhiqiang Yi, Wenxiao Fang, Changjian Zhou
Formato:	article
Lenguaje:	EN
Publicado:	Wiley 2022
Materias:	Electrical engineering. Electronics. Nuclear engineering TK1-9971
Acceso en línea:	https://doaj.org/article/a70cebc5c0d349a49dff8231312c9424
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spelling	oai:doaj.org-article:a70cebc5c0d349a49dff8231312c94242021-12-01T10:55:36ZA two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement1751-88301751-882210.1049/smt2.12083https://doaj.org/article/a70cebc5c0d349a49dff8231312c94242022-01-01T00:00:00Zhttps://doi.org/10.1049/smt2.12083https://doaj.org/toc/1751-8822https://doaj.org/toc/1751-8830Abstract This paper develops an active magnetic near field probe (H‐field probe) by using a four‐layer printed circuit board (PCB) technique. Two‐turn detection structure and a low noise amplifier are used to improve probe's frequency response. The two‐turn detection structure can maximize the use of PCB stack resources, and a 14.5 dB gain amplifier can increase signal output capability. The probe can then be used for electromagnetic compatibility (EMC) test from 150 kHz to 3 GHz. Compared with traditional active shielded‐loop H‐field probe (TAHP) with loop area of 500 μm2, the frequency response of the proposed probe can improve 20 dB at 0.5 GHz. Different from the method of comparing the sensitivity of the probe only through the frequency response, this paper measures and analyzes the real sensitivity of the probing device composed of the proposed probe. Under the condition of the same receiver parameter setting, the sensitivity at 0.5 GHz is increased by 11.7 dB compared with commercial passive probing device and 20.2 dB at 0.5 GHz compared with the probing device with TAHP device. It reaches −32.4 dB μA. In addition, the proposed probe has acceptable spatial resolution of 1.28 mm at 1 GHz, which is more suitable for printed circuit board level EMI analysis.Weiheng ShaoJianke LiQuan HuangE ShaoJiesheng LiuXiao HeZhiqiang YiWenxiao FangChangjian ZhouWileyarticleElectrical engineering. Electronics. Nuclear engineeringTK1-9971ENIET Science, Measurement & Technology, Vol 16, Iss 1, Pp 40-49 (2022)
institution	DOAJ
collection	DOAJ
language	EN
topic	Electrical engineering. Electronics. Nuclear engineering TK1-9971
spellingShingle	Electrical engineering. Electronics. Nuclear engineering TK1-9971 Weiheng Shao Jianke Li Quan Huang E Shao Jiesheng Liu Xiao He Zhiqiang Yi Wenxiao Fang Changjian Zhou A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement
description	Abstract This paper develops an active magnetic near field probe (H‐field probe) by using a four‐layer printed circuit board (PCB) technique. Two‐turn detection structure and a low noise amplifier are used to improve probe's frequency response. The two‐turn detection structure can maximize the use of PCB stack resources, and a 14.5 dB gain amplifier can increase signal output capability. The probe can then be used for electromagnetic compatibility (EMC) test from 150 kHz to 3 GHz. Compared with traditional active shielded‐loop H‐field probe (TAHP) with loop area of 500 μm2, the frequency response of the proposed probe can improve 20 dB at 0.5 GHz. Different from the method of comparing the sensitivity of the probe only through the frequency response, this paper measures and analyzes the real sensitivity of the probing device composed of the proposed probe. Under the condition of the same receiver parameter setting, the sensitivity at 0.5 GHz is increased by 11.7 dB compared with commercial passive probing device and 20.2 dB at 0.5 GHz compared with the probing device with TAHP device. It reaches −32.4 dB μA. In addition, the proposed probe has acceptable spatial resolution of 1.28 mm at 1 GHz, which is more suitable for printed circuit board level EMI analysis.
format	article
author	Weiheng Shao Jianke Li Quan Huang E Shao Jiesheng Liu Xiao He Zhiqiang Yi Wenxiao Fang Changjian Zhou
author_facet	Weiheng Shao Jianke Li Quan Huang E Shao Jiesheng Liu Xiao He Zhiqiang Yi Wenxiao Fang Changjian Zhou
author_sort	Weiheng Shao
title	A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement
title_short	A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement
title_full	A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement
title_fullStr	A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement
title_full_unstemmed	A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement
title_sort	two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement
publisher	Wiley
publishDate	2022
url	https://doaj.org/article/a70cebc5c0d349a49dff8231312c9424
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A two‐turn loop active magnetic field probe design for high sensitivity near‐field measurement

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