Optical constants of ZnSxSe1–x thin films calculated from transmission spectra
We report the results of calculations of some optical parameters of ZnSxSe1–x thin films based on measured transmission spectra by using the Swanepoel’s method, the Wemple– DiDomenico single-oscillator model, and the Sellmeier single-oscillator model. The following optical constants have been determ...
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| Autores principales: | , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
D.Ghitu Institute of Electronic Engineering and Nanotechnologies
2017
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/a744a02f392241e28993b03befc2240a |
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| Sumario: | We report the results of calculations of some optical parameters of ZnSxSe1–x thin films based on measured transmission spectra by using the Swanepoel’s method, the Wemple– DiDomenico single-oscillator model, and the Sellmeier single-oscillator model. The following optical constants have been determined: refractive index n(l),extinction coefficient k(l), the E0 parameter, dispersion parameter Ed, oscillator strength S0, real e1(l) and imaginary e2(l) parts of the dielectric constant, high-frequency dielectric constant e∞, and ratio N/m*. The obtained data are in good agreement with the data for bulk ZnSe and ZnS crystals. |
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