Optical constants of ZnSxSe1–x thin films calculated from transmission spectra

Optical constants of ZnSxSe1–x thin films calculated from transmission spectra

We report the results of calculations of some optical parameters of ZnSxSe1–x thin films based on measured transmission spectra by using the Swanepoel’s method, the Wemple– DiDomenico single-oscillator model, and the Sellmeier single-oscillator model. The following optical constants have been determ...

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Autores principales: Popa, Mihail, Tighineanu, Ion, Ursachi, Veaceslav
Formato: article
Lenguaje:EN
Publicado: D.Ghitu Institute of Electronic Engineering and Nanotechnologies 2017
Materias:
Physics
QC1-999
Electronics
TK7800-8360
Acceso en línea:https://doaj.org/article/a744a02f392241e28993b03befc2240a
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spelling oai:doaj.org-article:a744a02f392241e28993b03befc2240a2021-11-21T11:57:04ZOptical constants of ZnSxSe1–x thin films calculated from transmission spectra2537-63651810-648Xhttps://doaj.org/article/a744a02f392241e28993b03befc2240a2017-07-01T00:00:00Zhttps://mjps.nanotech.md/archive/2017/article/71746https://doaj.org/toc/1810-648Xhttps://doaj.org/toc/2537-6365We report the results of calculations of some optical parameters of ZnSxSe1–x thin films based on measured transmission spectra by using the Swanepoel’s method, the Wemple– DiDomenico single-oscillator model, and the Sellmeier single-oscillator model. The following optical constants have been determined: refractive index n(l),extinction coefficient k(l), the E0 parameter, dispersion parameter Ed, oscillator strength S0, real e1(l) and imaginary e2(l) parts of the dielectric constant, high-frequency dielectric constant e∞, and ratio N/m*. The obtained data are in good agreement with the data for bulk ZnSe and ZnS crystals.Popa, MihailTighineanu, IonUrsachi, VeaceslavD.Ghitu Institute of Electronic Engineering and NanotechnologiesarticlePhysicsQC1-999ElectronicsTK7800-8360ENMoldavian Journal of the Physical Sciences, Vol 16, Iss 1-2, Pp 78-93 (2017)
institution DOAJ
collection DOAJ
language EN
topic Physics
QC1-999
Electronics
TK7800-8360
spellingShingle Physics
QC1-999
Electronics
TK7800-8360
Popa, Mihail
Tighineanu, Ion
Ursachi, Veaceslav
Optical constants of ZnSxSe1–x thin films calculated from transmission spectra
description We report the results of calculations of some optical parameters of ZnSxSe1–x thin films based on measured transmission spectra by using the Swanepoel’s method, the Wemple– DiDomenico single-oscillator model, and the Sellmeier single-oscillator model. The following optical constants have been determined: refractive index n(l),extinction coefficient k(l), the E0 parameter, dispersion parameter Ed, oscillator strength S0, real e1(l) and imaginary e2(l) parts of the dielectric constant, high-frequency dielectric constant e∞, and ratio N/m*. The obtained data are in good agreement with the data for bulk ZnSe and ZnS crystals.
format article
author Popa, Mihail
Tighineanu, Ion
Ursachi, Veaceslav
author_facet Popa, Mihail
Tighineanu, Ion
Ursachi, Veaceslav
author_sort Popa, Mihail
title Optical constants of ZnSxSe1–x thin films calculated from transmission spectra
title_short Optical constants of ZnSxSe1–x thin films calculated from transmission spectra
title_full Optical constants of ZnSxSe1–x thin films calculated from transmission spectra
title_fullStr Optical constants of ZnSxSe1–x thin films calculated from transmission spectra
title_full_unstemmed Optical constants of ZnSxSe1–x thin films calculated from transmission spectra
title_sort optical constants of znsxse1–x thin films calculated from transmission spectra
publisher D.Ghitu Institute of Electronic Engineering and Nanotechnologies
publishDate 2017
url https://doaj.org/article/a744a02f392241e28993b03befc2240a
work_keys_str_mv AT popamihail opticalconstantsofznsxse1xthinfilmscalculatedfromtransmissionspectra
AT tighineanuion opticalconstantsofznsxse1xthinfilmscalculatedfromtransmissionspectra
AT ursachiveaceslav opticalconstantsofznsxse1xthinfilmscalculatedfromtransmissionspectra
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