Cita APA (7a ed.)

Zhou, S., & Wang, J. (2021). An RF Stress-Based Thermal Shock Test Method for a CMOS Power Amplifier. IEEE.

Cita Chicago Style (17a ed.)

Zhou, Shaohua, y Jian Wang. An RF Stress-Based Thermal Shock Test Method for a CMOS Power Amplifier. IEEE, 2021.

Cita MLA (8a ed.)

Zhou, Shaohua, y Jian Wang. An RF Stress-Based Thermal Shock Test Method for a CMOS Power Amplifier. IEEE, 2021.