APA (7th ed.) Citation

Chen, Y. T., Music, D., Shang, L., Mayer, J., & Schneider, J. M. (2017). Nanometre-scale 3D defects in Cr2AlC thin films. Nature Portfolio.

Chicago Style (17th ed.) Citation

Chen, Y. T., D. Music, L. Shang, J. Mayer, and J. M. Schneider. Nanometre-scale 3D Defects in Cr2AlC Thin Films. Nature Portfolio, 2017.

MLA (8th ed.) Citation

Chen, Y. T., et al. Nanometre-scale 3D Defects in Cr2AlC Thin Films. Nature Portfolio, 2017.