Cita APA (7a ed.)

Chen, Y. T., Music, D., Shang, L., Mayer, J., & Schneider, J. M. (2017). Nanometre-scale 3D defects in Cr2AlC thin films. Nature Portfolio.

Cita Chicago Style (17a ed.)

Chen, Y. T., D. Music, L. Shang, J. Mayer, y J. M. Schneider. Nanometre-scale 3D Defects in Cr2AlC Thin Films. Nature Portfolio, 2017.

Cita MLA (8a ed.)

Chen, Y. T., et al. Nanometre-scale 3D Defects in Cr2AlC Thin Films. Nature Portfolio, 2017.