Nanometre-scale 3D defects in Cr2AlC thin films
Abstract MAX-phase Cr2AlC containing thin films were synthesized by magnetron sputtering in an industrial system. Nanometre-scale 3D defects are observed near the boundary between regions of Cr2AlC and of the disordered solid solution (CrAl)xCy. Shrinkage of the Cr-Cr interplanar distance and elonga...
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| Autores principales: | , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2017
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/a826f5e922494d278f8d8cd86145a8f2 |
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